发明公开
EP1653266A1 Apparatus and method for correcting a non-linear characteristic of a scanned light beam
审中-公开
装置和方法，用于校正扫描一光束的非线性特性
- 专利标题： Apparatus and method for correcting a non-linear characteristic of a scanned light beam
- 专利标题（中）： 装置和方法，用于校正扫描一光束的非线性特性
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申请号： EP04025827.9申请日： 2004-10-29
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公开(公告)号： EP1653266A1公开(公告)日： 2006-05-03
- 发明人: McDonagh, Louis , Wallenstein, Richard, Prof. Dr.
- 申请人： Wallenstein, Richard, Prof. Dr.
- 申请人地址： Am Höllpfad 8 67271 Neuleiningen DE
- 专利权人： Wallenstein, Richard, Prof. Dr.
- 当前专利权人： Wallenstein, Richard, Prof. Dr.
- 当前专利权人地址： Am Höllpfad 8 67271 Neuleiningen DE
- 代理机构： von Hellfeld, Axel
- 主分类号： G02B13/00
- IPC分类号： G02B13/00 ; G02B26/08
摘要：
An apparatus and a method for correcting a non-linear, in particular a sinusoidal movement of a light beam scanned by a resonant scanner provide for deflection of the light beam (98a, 98b) such that a linear characteristic of the moved light beam is obtained over at least a portion of the scanning amplitude.
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