专利检索 ap:("Wallenstein, Richard, Prof. Dr.") AND inv:"McDonagh, Louis" 第 1 页

1.

发明公开
Apparatus and method for correcting a non-linear characteristic of a scanned light beam 审中-公开
标题翻译：装置和方法，用于校正扫描一光束的非线性特性

公开(公告)号：EP1653266A1

公开(公告)日：2006-05-03

申请号：EP04025827.9

申请日：2004-10-29

申请人： Wallenstein, Richard, Prof. Dr.

发明人： McDonagh, Louis , Wallenstein, Richard, Prof. Dr.

IPC分类号： G02B13/00 , G02B26/08

CPC分类号： G02B26/105 , G02B13/0005 , H04N2201/04762 , H04N2201/04763

摘要： An apparatus and a method for correcting a non-linear, in particular a sinusoidal movement of a light beam scanned by a resonant scanner provide for deflection of the light beam (98a, 98b) such that a linear characteristic of the moved light beam is obtained over at least a portion of the scanning amplitude.

摘要翻译： 的装置和用于校正非线性的方法，特别是通过一个谐振扫描器扫描的光束的正弦运动提供用于将光束的偏转（98A，98B）的搜索没有被移动的光束的线性特性得到在扫描振幅的至少一部分。