发明公开
EP1676295A2 APPARATUS TO IMPROVE WAFER TEMPERATURE UNIFORMITY FOR FACE-UP WET PROCESSING
审中-公开
DEVICE FOR改善晶片的温度均匀性FOR FRONT-UP湿式处理
- 专利标题: APPARATUS TO IMPROVE WAFER TEMPERATURE UNIFORMITY FOR FACE-UP WET PROCESSING
- 专利标题(中): DEVICE FOR改善晶片的温度均匀性FOR FRONT-UP湿式处理
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申请号: EP04794284.2申请日: 2004-10-05
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公开(公告)号: EP1676295A2公开(公告)日: 2006-07-05
- 发明人: PANCHAM , Ian, A. , NGUYEN, Son, T. , ROSEN, Gary, J.
- 申请人: APPLIED MATERIALS, INC.
- 申请人地址: 3050 Bowers Avenue Santa Clara, California 95054 US
- 专利权人: APPLIED MATERIALS, INC.
- 当前专利权人: APPLIED MATERIALS, INC.
- 当前专利权人地址: 3050 Bowers Avenue Santa Clara, California 95054 US
- 代理机构: Bayliss, Geoffrey Cyril
- 优先权: US680359 20031006; US680325 20031006
- 国际公布: WO2005036615 20050421
- 主分类号: H01L21/00
- IPC分类号: H01L21/00 ; C23C16/458 ; C23C18/16
摘要:
A method and apparatus for controlling a substrate temperature during an electroless deposition process. The apparatus includes a deposition cell configured to support a substrate at a position above a fluid distribution member. A heated fluid is dispensed from the fluid diffusion member and contacts the backside of the substrate, thus heating the substrate. The heated fluid is dispensed from apertures configured to maintain a constant temperature across the substrate surface. The method includes flowing a heated fluid through a diffusion member against a backside of the substrate in a configuration that is configured to generate a constant processing temperature across the front side of the substrate.
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