A method (34) for inspecting an object (12) using a structured light measurement system (10) that includes a light source (22) and an imaging sensor (24). The method includes emitting (36) light from the light source, polarizing (38) each of a plurality of different wavelengths of the light emitted from the light source at different polarization angles, projecting (40) light emitted from the light source onto a surface of an object, receiving (42) light reflected from the object surface with the imaging sensor, and analyzing (46) the light received by the imaging sensor to facilitate inspecting at least a portion of the object.