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57 条记录 (耗时 0.015 秒)

    Cutting tool abnormality sensing apparatus
    2.
    发明公开
    Cutting tool abnormality sensing apparatus 审中-公开
    Vorrichtung zur Messung derAnomalitäteines Schneidwerkzeugs

    公开(公告)号：EP2469365A2

    公开(公告)日：2012-06-27

    申请号：EP11194225.6

    申请日：2011-12-19

    申请人： General Electric Company

    发明人： Jeyaraman, Satheesh ,  Harding, Kevin George ,  Navalgund, Megha ,  Pfeiffer, John Robert ,  Venkatakrishnan, Shaileshh Bojja

    IPC分类号： G05B19/4065

    CPC分类号： G05B19/4065 ,  B23Q17/2409 ,  G05B2219/37233 ,  G05B2219/37243 ,  G05B2219/37256 ,  G05B2219/37559 ,  G05B2219/45161 ,  Y10T408/16

    摘要： A cutting tool abnormality sensing apparatus (200) is disclosed. The apparatus (200) includes an image pickup device (202) for taking individual images of teeth of the cutting tool (100). The apparatus (200) further includes a triggering mechanism (204) for triggering the image pickup device (202) each time a tooth passes along a field of view of the image pickup device (202). One or more light sources (208, 210 and 212) are provided to illuminate the cutting tool (100). Further, the apparatus (200) includes an image processor (220) to process one or more criteria in the individual images for quantifying an extent of abnormality in the cutting tool (100).

    摘要翻译： 公开了一种切削刀具异常检测装置（200）。 该装置（200）包括用于拍摄切割工具（100）的各种图像的图像拾取装置（202）。 所述装置（200）还包括每当牙齿沿着图像拾取装置（202）的视场通过时触发图像拾取装置（202）的触发机构（204）。 提供一个或多个光源（208,210和212）以照亮切割工具（100）。 此外，装置（200）包括图像处理器（220），用于处理各个图像中的一个或多个标准，以量化切割工具（100）中的异常程度。

    Optical measurement systems and methods
    3.
    发明公开
    Optical measurement systems and methods 审中-公开
    Optischmessverfahren

    公开(公告)号：EP2463619A1

    公开(公告)日：2012-06-13

    申请号：EP11192790.1

    申请日：2011-12-09

    申请人： General Electric Company

    发明人： Tao, Li ,  Song, Guiju ,  Wan, Xinjun ,  Harding, Kevin George ,  Hayashi, Steven Robert ,  Hoffman, James Joseph ,  Muchmore, Charles Walter ,  Williams, Yana Zhang ,  Xu, Shukuan

    IPC分类号： G01B11/25 ,  G01S17/89

    CPC分类号： G01B11/2513 ,  G01B11/2527 ,  G01S17/36 ,  G01S17/89

    摘要： A measurement system comprises a light source unit, a projection unit and an optics unit. The light source unit is configured to generate a plurality of modulated phase shifted light beams. The projection unit is configured to reflect the modulated phase shifted light beams onto an object surface. The optics unit is configured to capture the modulated phase shifted light beams from the object surface. The measurement system further comprises a photodetector and a processor. The photodetector is configured to receive the modulated phase shifted light beams from the optics unit to generate electrical signals. The processor is configured to retrieve position information of the object surface based on the electrical signals from the photodetector. A measurement method is also presented.

    摘要翻译： 测量系统包括光源单元，投影单元和光学单元。 光源单元被配置为产生多个调制相移光束。 投影单元被配置为将调制的相移光束反射到物体表面上。 光学单元被配置为捕获来自物体表面的经调制的相移光束。 测量系统还包括光电检测器和处理器。 光电检测器被配置为从光学单元接收经调制的相移光束以产生电信号。 处理器被配置为基于来自光电检测器的电信号来检索物体表面的位置信息。 还提出了一种测量方法。

    Systems for measuring distance by optic means
    4.
    发明公开
    Systems for measuring distance by optic means 审中-公开
    Systeme zur optischen Abstandsmessung

    公开(公告)号：EP2463617A1

    公开(公告)日：2012-06-13

    申请号：EP11192792.7

    申请日：2011-12-09

    申请人： General Electric Company

    发明人： Wan, Xinjun ,  Song, Guiju ,  Harding, Kevin George ,  Xu, Shukuan ,  Hayashi, Steven Robert ,  Tait, Robert William ,  Hoffman, James Joseph ,  Muchmore, Charles Walter ,  Gluesenkamp, Matthew Michael

    IPC分类号： G01B11/02 ,  G01B9/02

    CPC分类号： G01B11/026

    摘要： A distance measurement system comprises an optical distance sensor configured to generate a light beam, a first optical module, and a processor. The first optical module is configured to receive the light beam, and generate and selectively transmit a plurality of light beams having different light channels for projection onto one or more points of an object to generate one or more reflected light beams scattered from the respective one or more points of the object, and capture and transmit the one or more reflected light beams into the optical distance sensor to retrieve a plurality of distance data to the respective one or more points of the object. The processor is configured to process the distance data to determine position information of the respective one or more points of the object. A distance measurement method is also presented.

    摘要翻译： 距离测量系统包括被配置为产生光束的光学距离传感器，第一光学模块和处理器。 第一光学模块被配置为接收光束，并且生成并选择性地透射具有不同光通道的多个光束，用于投影到物体的一个或多个点上，以产生从相应的一个或多个散射的一个或多个反射光束， 并且将一个或多个反射光束捕获并传输到光学距离传感器中，以将多个距离数据提取到对象的相应一个或多个点。 处理器被配置为处理距离数据以确定对象的相应一个或多个点的位置信息。 还提出了一种距离测量方法。

    Methods and apparatus for generating a mask for inspecting an object using structured light
    8.
    发明公开
    Methods and apparatus for generating a mask for inspecting an object using structured light 审中-公开
    用于产生掩模使用结构光来检查物体的方法和装置

    公开(公告)号：EP1777492A2

    公开(公告)日：2007-04-25

    申请号：EP06255447.2

    申请日：2006-10-23

    申请人： General Electric Company

    发明人： Harding, Kevin George ,  Qian, Xiaoping ,  Demuth, Russel Stephen

    IPC分类号： G01B11/25

    CPC分类号： G01B11/2513

    摘要： A method (100) and apparatus for generating a mask (52) for use with a light measurement system (10) that includes a light source (22) for projecting light onto a surface of an object (12), and an imaging system for receiving light reflected from the surface of the object. A profile of the object to be inspected is determined and a mask based on the determined profile is generated, wherein the mask includes an opening (172) extending therethrough that has a profile that substantially matches a profile of the object as viewed from the light source.

    摘要翻译： 一种用于生成使用掩模（52）与光测量系统（10）做方法（100）和装置包括：用于光投射到物体（12）的一个表面上的光源（22），并且在成像系统 接收光从所述物体的表面反射。 要被检查的对象的轮廓是确定性的开采，并生成基于该确定性开采轮廓掩模，worin所述掩模包括在开口（172）延伸穿过那里做它的轮廓也大致匹配作为从光源观察的对象的轮廓 ，

    Method and apparatus for inspecting an object
    9.
    发明公开
    Method and apparatus for inspecting an object 有权
    为对象的控制方法和装置

    公开(公告)号：EP1777489A1

    公开(公告)日：2007-04-25

    申请号：EP06255431.6

    申请日：2006-10-23

    申请人： General Electric Company

    发明人： Harding, Kevin George

    IPC分类号： G01B11/25

    CPC分类号： G01B11/2509

    摘要： A method (34) for inspecting an object (12) using a structured light measurement system (10) that includes a light source (22) and an imaging sensor (24). The method includes emitting (36) light from the light source, polarizing (38) each of a plurality of different wavelengths of the light emitted from the light source at different polarization angles, projecting (40) light emitted from the light source onto a surface of an object, receiving (42) light reflected from the object surface with the imaging sensor, and analyzing (46) the light received by the imaging sensor to facilitate inspecting at least a portion of the object.

    Multi-resolution inspection system and method of operating same
    10.
    发明公开
    Multi-resolution inspection system and method of operating same 审中-公开
    系统和方法检查多分辨率

    公开(公告)号：EP1582863A1

    公开(公告)日：2005-10-05

    申请号：EP05251818.0

    申请日：2005-03-23

    申请人： GENERAL ELECTRIC COMPANY

    发明人： Harding, Kevin George ,  Ross, Joseph Benjamin

    IPC分类号： G01N21/88 ,  G06T7/00

    CPC分类号： G01N21/8806 ,  G01N21/9515 ,  G01N2021/8867 ,  G01N2021/8874

    摘要： A multi-resolution inspection system (10) and method of operation. The system (10) may comprise a first scanning system (16) having a first resolution, wherein the first scanning system (16) is operable to perform a first resolution scan of a surface area (22) of an object (14) to identify a location of a surface abnormality in the object (14). The system may also comprise a second scanning system (18) having a second resolution, the second resolution being smaller than the first resolution. The second scanning system (18) is operable to receive the location of the surface abnormality from the first scanning system (16) and to automatically perform a second resolution scan of a defined region of the object (14) around the location of the surface abnormality.