发明公开
EP1777535A3 System and method for glitch detection in a secure microcontroller
审中-公开
装置和方法用于在受保护的微处理器干扰检测
- 专利标题: System and method for glitch detection in a secure microcontroller
- 专利标题(中): 装置和方法用于在受保护的微处理器干扰检测
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申请号: EP06255109.8申请日: 2006-10-03
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公开(公告)号: EP1777535A3公开(公告)日: 2007-10-31
- 发明人: Fruhauf, Serge F. , Pomet, Alain C.
- 申请人: STMicroelectronics, Inc. , STMICROELECTRONICS SA
- 申请人地址: 1310 Electronics Drive Carrollton Texas 75006 US
- 专利权人: STMicroelectronics, Inc.,STMICROELECTRONICS SA
- 当前专利权人: STMicroelectronics, Inc.,STMICROELECTRONICS SA
- 当前专利权人地址: 1310 Electronics Drive Carrollton Texas 75006 US
- 代理机构: Style, Kelda Camilla Karen
- 优先权: US243328 20051004
- 主分类号: G01R31/317
- IPC分类号: G01R31/317 ; G06K19/073
摘要:
An apparatus includes a plurality of macrocells (402-406) formed from logic capable of performing one or more functions. The apparatus also includes a clock tree (408) capable of receiving a clock signal and providing at least one copy of the clock signal to each macrocell. The clock tree includes a local branch (410-414) within each macrocell, where each local branch is capable of providing at least one copy of the clock signal. In addition, the apparatus includes at least one glitch detection circuit capable of detecting (418) a glitch in one or more copies of the clock signal provided by the local branches in the macrocells.
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