发明公开
- 专利标题： SYSTEM AND METHOD FOR STEGANALYSIS
- 专利标题（中）： 系统和方法STEG分析
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申请号： EP06719647.7申请日： 2006-01-25
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公开(公告)号： EP1849124A2公开(公告)日： 2007-10-31
- 发明人: SHI, Yun-qing , XUAN, Guorong
- 申请人： New Jersey Institute of Technology
- 申请人地址： University of Heights 323 Martin Luther King Blvd. Newark, NJ 07102 US
- 专利权人： New Jersey Institute of Technology
- 当前专利权人： New Jersey Institute of Technology
- 当前专利权人地址： University of Heights 323 Martin Luther King Blvd. Newark, NJ 07102 US
- 代理机构： Lenzing, Andreas
- 优先权： US646972P 20050126
- 国际公布： WO2006081386 20060803
- 主分类号： G06K9/00
- IPC分类号： G06K9/00 ; G06K9/62
摘要：
A system and method for steganalysis are disclosed which involves generating features based at least in part on moments of a characteristic function of an image and classifying said image based at least in part on said generated features.
公开/授权文献
- EP1849124B1 SYSTEM AND METHOD FOR STEGANALYSIS 公开/授权日：2010-09-08
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