发明公开
- 专利标题: Method of growing gallium nitride crystal
- 专利标题(中): 氮化镓的生长过程
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申请号: EP07010274.4申请日: 2007-05-23
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公开(公告)号: EP1865095A3公开(公告)日: 2009-06-17
- 发明人: Okahisa, Takuji , Motoki, Kensaku , Uematsu, Koji , Nakahata, Seiji , Hirota, Ryu , Ijiri, Hideyuki , Kasai, Hitoshi , Fujita, Shunsuke , Sato, Fumitaka , Matsuoka, Toru
- 申请人: Sumitomo Electric Industries, Ltd.
- 申请人地址: 5-33 Kitahama 4-chome, Chuo-ku Osaka-shi, Osaka 541-0041 JP
- 专利权人: Sumitomo Electric Industries, Ltd.
- 当前专利权人: Sumitomo Electric Industries, Ltd.
- 当前专利权人地址: 5-33 Kitahama 4-chome, Chuo-ku Osaka-shi, Osaka 541-0041 JP
- 代理机构: Grünecker, Kinkeldey, Stockmair & Schwanhäusser Anwaltssozietät
- 优先权: JP2006159880 20060608
- 主分类号: C30B29/40
- IPC分类号: C30B29/40 ; C30B25/04 ; C30B25/02
摘要:
A method of growing a gallium nitride crystal, includes: a step of partially forming, on a ground substrate (U), a mask (M) inhibiting epitaxial growth of a gallium nitride crystal; and a step of epitaxially growing, while doping carbon, the gallium nitride crystal on the ground substrate (U) in which the mask (M) is formed. In the epitaxial growth, a first crystal region is grown from a periphery of the mask (M) toward inside. C-axis direction is reversed in the first crystal region relative to a second crystal region grown on a region where the mask (M) is not formed in the ground substrate (U). Therefore, a stable crystal grain boundary is produced at the boundary between the first and second regions, and a density of dislocations in the crystal is efficiently reduced.
公开/授权文献
- EP1865095A2 Method of growing gallium nitride crystal 公开/授权日:2007-12-12
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