摘要:
A fabrication method of a group III nitride crystal substance includes the steps of cleaning the interior of a reaction chamber (110) by introducing HCl gas (1) into the reaction chamber (110), and vapor deposition of a group III nitride crystal substance in the cleaned reaction chamber (110). A fabrication apparatus of a group III nitride crystal substance includes a configuration to introduce HCl gas (1) into the reaction chamber (110), and a configuration to grow a group III nitride crystal substance (11) by HVPE. Thus, a fabrication method of a group III nitride crystal substance including the method of effectively cleaning deposits adhering inside the reaction chamber during crystal growth, and a fabrication apparatus employed in the fabrication method are provided.
摘要:
A group-III nitride light-emitting device is provided. An active layer having a quantum well structure is grown on a basal plane of a gallium nitride based semiconductor region. The quantum well structure is formed in such a way as to have an emission peak wavelength of 410 nm or more. The thickness of a well layer is 4 nm or more, and 10 nm or less. The well layer is composed of In X Ga 1-X N (0.15 ≤ X
摘要:
The present invention provides an epitaxial wafer comprising a (111) substrate of a semiconductor having cubic crystal structure, a first GaN layer having a thickness of 60 nanometers or more, a second GaN layer having a thickness of 0.1 µm or more.
摘要:
An n-type GaN substrate having a safe n-type dopant instead of Si which is introduced by perilous silane gas. The safe n-dopant is oxygen. An oxygen doped n-type GaN free-standing crystal is made by forming a mask on a GaAs substrate, making apertures on the mask for revealing the undercoat GaAs, growing GaN films through the apertures of the mask epitaxially on the GaAs substrate from a material gas including oxygen, further growing the GaN film also upon the mask for covering the mask, eliminating the GaAs substrate and the mask, and isolating a freestanding GaN single crystal. The GaN is an n-type crystal having carriers in proportion to the oxygen concentration.
摘要:
A method of growing a gallium nitride crystal, includes: a step of partially forming, on a ground substrate (U), a mask (M) inhibiting epitaxial growth of a gallium nitride crystal; and a step of epitaxially growing, while doping carbon, the gallium nitride crystal on the ground substrate (U) in which the mask (M) is formed. In the epitaxial growth, a first crystal region is grown from a periphery of the mask (M) toward inside. C-axis direction is reversed in the first crystal region relative to a second crystal region grown on a region where the mask (M) is not formed in the ground substrate (U). Therefore, a stable crystal grain boundary is produced at the boundary between the first and second regions, and a density of dislocations in the crystal is efficiently reduced.
摘要:
A method of growing a gallium nitride crystal according to the present invention includes: a step of partially forming, on a ground substrate (U), a mask (M) inhibiting epitaxial growth of the crystal; and a step of epitaxially growing the crystal by vapor phase deposition on the ground substrate (U) on which the mask (M) is formed, wherein in the step of epitaxially growing the crystal, the crystal is grown under a first growth condition wherein a growth rate Vj expressed in µm/h unit and a growth temperature T expressed in absolute temperature are expressed by (a 1 / T + b 1 ) 2 / T + b 2 ) using coefficients a 1 = -4.39 × 10 5 , b 1 = 3.87 × 10 2 , a 2 = -7.36 × 10 5 , and b 2 =7.37 × 10 2 . In this manner, the dislocation density in the crystal is reduced.
摘要翻译:根据本发明的生长氮化镓晶体的方法包括:在接地衬底(U)上部分地形成抑制晶体的外延生长的掩模(M)的步骤; 以及通过气相沉积在其上形成有掩模(M)的接地衬底(U)上外延生长晶体的步骤,其中在晶体外延生长的步骤中,晶体在第一生长条件下生长,其中, 用(a 1 / T + b 1)
摘要:
A method of producing a gallium nitride-type light emitting semiconductor device comprising the steps of growing GaN-type semiconductor epitaxial layers on a (0001) top surface gallium nitride single crystal substrate; forming an electrode on the GaN-type semiconductor epitaxial layers; forming an electrode on a bottom surface of the gallium nitride single crystal substrate; forming scribing lines on the bottom surface of the gallium nitride single crystal substrate along {1-100} planes of the gallium nitride single crystal substrate; cutting the gallium nitride single crystal substrate into chips by cleaving along the scribed lines and obtaining light emitting device chips having sides consisting of {1-100} planes made by natural cleavage.
摘要:
Oxygen can be doped into a gallium nitride crystal by preparing a non-C-plane gallium nitride seed crystal, supplying material gases including gallium, nitrogen and oxygen to the non-C-plane gallium nitride seed crystal, growing a non-C-plane gallium nitride crystal on the non-C-plane gallium nitride seed crystal and allowing oxygen to infiltrating via a non-C-plane surface to the growing gallium nitride crystal. Otherwise, oxygen can be doped into a gallium nitride crystal by preparing a C-plane gallium nitride seed crystal or a three-rotationally symmetric plane foreign material seed crystal, supplying material gases including gallium, nitrogen and oxygen to the C-plane gallium nitride seed crystal or the three-rotationally symmetric foreign seed crystal, growing a faceted C-plane gallium nitride crystal having facets of non-C-planes on the seed crystal, maintaining the facets on the C-plane gallium nitride crystal and allowing oxygen to infiltrating via the non-C-plane facets to the gallium nitride crystal.