发明授权
- 专利标题: PROCEDE DE DIMINUTION DE LA RUGOSITE D'UNE COUCHE EPAISSE D'ISOLANT
- 专利标题(英): Method for reducing roughness of a thick insulating layer
- 专利标题(中): 方法对于厚的二层隔离来减少粗糙度
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申请号: EP06777736.7申请日: 2006-07-12
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公开(公告)号: EP1902463B1公开(公告)日: 2011-09-14
- 发明人: DAVAL, Nicolas , KERDILES, Sébastien , AULNETTE, Cécile
- 申请人: S.O.I.Tec Silicon on Insulator Technologies
- 申请人地址: Chemin des Franques 38190 Bernin FR
- 专利权人: S.O.I.Tec Silicon on Insulator Technologies
- 当前专利权人: S.O.I.Tec Silicon on Insulator Technologies
- 当前专利权人地址: Chemin des Franques 38190 Bernin FR
- 代理机构: Bomer, Françoise Marie
- 优先权: FR0507573 20050713
- 国际公布: WO2007006803 20070118
- 主分类号: H01L21/762
- IPC分类号: H01L21/762
摘要:
The invention concerns a method for making a substrate adapted to be used in the field of electronics, optoelectronics and optics, characterized in that it includes at least the following successive steps: a) depositing on a donor substrate (1) an insulating layer (2) whereof the thickness is not less than 20 nm and whereof the roughness is not less than 3 angstroms RMS, for a sweep of 2 νm x 2 νm; b) smoothing treatment (SP) of the free surface (20) of said insulating layer (2), using a gas plasma, formed in a chamber under gas pressure higher than 0.25 Pa, said plasma being generated by means of a radio frequency RF generator, which enables said insulating layer (2) to be imparted with a power density higher than 0.6 W/cm2, the duration of said smoothing treatment being not less than 10 seconds; c) forming a weakened zone (10) by implanting atomic species, inside said donor substrate (1), to delimit therein a so-called 'active' layer (11) and a residue (12).
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