发明授权
- 专利标题: USE OF SEQUENTIAL CLUSTERING FOR INSTANCE SELECTION IN MACHINE CONDITION MONITORING
- 专利标题(中): 连续集聚例如选择使用机器状态监测
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申请号: EP06838989.9申请日: 2006-12-05
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公开(公告)号: EP1958034B1公开(公告)日: 2009-10-14
- 发明人: BALDERER, Christian , YUAN, Chao , NEUBAUER, Claus
- 申请人: SIEMENS CORPORATE RESEARCH, INC.
- 申请人地址: 755 College Road East Princeton, New Jersey 08540 US
- 专利权人: SIEMENS CORPORATE RESEARCH, INC.
- 当前专利权人: SIEMENS CORPORATE RESEARCH, INC.
- 当前专利权人地址: 755 College Road East Princeton, New Jersey 08540 US
- 代理机构: Clarke, Alison Clare
- 优先权: US742505P 20051205; US565805 20061201
- 国际公布: WO2007067521 20070614
- 主分类号: G05B17/02
- IPC分类号: G05B17/02 ; G05B23/02
摘要:
A method is provided for selecting a representative set of training data for training a statistical model in a machine condition monitoring system. The method reduces the time required to choose representative samples from a large data set by using a nearest-neighbor sequential clustering technique in combination with akd-tree. A distance threshold is used to limit the geometric size the clusters. Each node of the kd-tree is assigned a representative sample from the training data, and similar samples are subsequently discarded.
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