发明公开
EP1990637A2 System and methods for inspecting internal cracks
审中-公开
Vorrichtung und Verfahren zur Inspektion tiefliegender Risse
- 专利标题: System and methods for inspecting internal cracks
- 专利标题(中): Vorrichtung und Verfahren zur Inspektion tiefliegender Risse
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申请号: EP08155344.8申请日: 2008-04-29
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公开(公告)号: EP1990637A2公开(公告)日: 2008-11-12
- 发明人: Wang, Changting , Nath, Shridhar Champaknath , Griffin, Weston Blaine , Fields, Michael Wayne , Hallman, Darren Lee , Al-Khalidy, Abdul Rahman Abdallah
- 申请人: GENERAL ELECTRIC COMPANY
- 申请人地址: 1 River Road Schenectady, NY 12345 US
- 专利权人: GENERAL ELECTRIC COMPANY
- 当前专利权人: GENERAL ELECTRIC COMPANY
- 当前专利权人地址: 1 River Road Schenectady, NY 12345 US
- 代理机构: Bedford, Grant Richard
- 优先权: US745122 20070507
- 主分类号: G01N27/90
- IPC分类号: G01N27/90
摘要:
A method (60) for inspecting an internal cavity (44) in a part (12) is provided. The method (60) includes inserting (62) a probe (14) into the internal cavity (44). The method (60) also includes controlling (62) movement of the probe (14) using a defined scan path to scan the probe (14) over a region of interest in the internal cavity (44). The method (60) also includes applying (64) multiple multifrequency excitation signals to the probe (14) to generate a number of multifrequency response signals. The multifrequency excitation signals are applied (68) at multiple positions within the internal cavity (14). The method (60) further includes performing a multifrequency phase analysis on the multifrequency response signals to inspect the internal cavity (14).
公开/授权文献
- EP1990637A3 System and methods for inspecting internal cracks 公开/授权日:2012-10-17
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