公开(公告)号：EP1701157B1

公开(公告)日：2018-05-16

申请号：EP06251183.7

申请日：2006-03-06

申请人： GENERAL ELECTRIC COMPANY

发明人： Wang, Changting ,  Suh, Ui ,  McNight, William Stewart ,  Ertekin, Serkan

IPC分类号： G01N27/90

CPC分类号： G01N27/9046 ,  G01N27/9086

摘要： An inspection system (10) is provided and includes an eddy current (EC) probe (12) configured to induce eddy currents in a part (18). The system (10) further includes an eddy current instrument (14) coupled to the EC probe (12) and configured to apply multifrequency excitation signals to the EC probe (12) to generate multifrequency response signals. The system (10) further includes a processor (16) configured to analyze the multifrequency response signals from the EC instrument (14) by performing a multifrequency phase analysis, to inspect a subsurface of the part (18).

公开(公告)号：EP1990637A3

公开(公告)日：2012-10-17

申请号：EP08155344.8

申请日：2008-04-29

申请人： GENERAL ELECTRIC COMPANY

发明人： Wang, Changting ,  Nath, Shridhar Champaknath ,  Griffin, Weston Blaine ,  Fields, Michael Wayne ,  Hallman, Darren Lee ,  Al-Khalidy, Abdul Rahman Abdallah

IPC分类号： G01N27/90

CPC分类号： G01N27/9046 ,  G01N27/902

摘要： A method (60) for inspecting an internal cavity (44) in a part (12) is provided. The method (60) includes inserting (62) a probe (14) into the internal cavity (44). The method (60) also includes controlling (62) movement of the probe (14) using a defined scan path to scan the probe (14) over a region of interest in the internal cavity (44). The method (60) also includes applying (64) multiple multifrequency excitation signals to the probe (14) to generate a number of multifrequency response signals. The multifrequency excitation signals are applied (68) at multiple positions within the internal cavity (14). The method (60) further includes performing a multifrequency phase analysis on the multifrequency response signals to inspect the internal cavity (14).

公开(公告)号：EP2056102A3

公开(公告)日：2009-11-25

申请号：EP08166997.0

申请日：2008-10-20

申请人： General Electric Company

发明人： Mcknight, William Stewart ,  Suh, Ui ,  Plotnikov, Yuri ,  Wang, Changting ,  Isaacs, Ralph Gerald

IPC分类号： G01N27/90

CPC分类号： G01N27/904 ,  Y10T29/49002

摘要： An eddy current testing device (50) is provided. The eddy current testing device includes an eddy current array probe (70) including a tip portion, and a plurality of differential side mount coils (130, 132, 134, 136, 138, 140, 142, 144) positioned at least partially within the tip portion (110) of the eddy current array probe, the plurality of differential side mount coils flexibly coupled together to form an array (128) of coils.

公开(公告)号：EP2056102A2

公开(公告)日：2009-05-06

申请号：EP08166997.0

申请日：2008-10-20

申请人： General Electric Company

发明人： Mcknight, William Stewart ,  Suh, Ui ,  Plotnikov, Yuri ,  Wang, Changting ,  Isaacs, Ralph Gerald

IPC分类号： G01N27/90

CPC分类号： G01N27/904 ,  Y10T29/49002

摘要： An eddy current testing device (50) is provided. The eddy current testing device includes an eddy current array probe (70) including a tip portion, and a plurality of differential side mount coils (130, 132, 134, 136, 138, 140, 142, 144) positioned at least partially within the tip portion (110) of the eddy current array probe, the plurality of differential side mount coils flexibly coupled together to form an array (128) of coils.

摘要翻译： 提供了一种涡流检测装置（50）。 所述涡流检测装置包括涡流阵列探头（70），所述涡流阵列探头包括末端部分和多个至少部分位于所述涡流阵列探头内的多个差分侧安装线圈（130,132,134,136,138,140,​​142,144） 涡流阵列探头的尖端部分（110），所述多个差分侧安装线圈柔性地耦合在一起以形成线圈阵列（128）。

公开(公告)号：EP1939616A1

公开(公告)日：2008-07-02

申请号：EP07123232.6

申请日：2007-12-14

申请人： General Electric Company

发明人： Suh, Ui Won ,  Gambrell, Gigi Olive ,  Mcknight, William Stewart ,  Pisupati, Preeti ,  Mishra, Peyush Kumar ,  Dewangan, Sandeep Kumar ,  Wang, Changting

IPC分类号： G01N27/90

CPC分类号： G01N27/9046 ,  G01N27/902 ,  G06K9/4604

摘要： A method for detecting small cracks (40) and other anomalies on parts (32) having complex geometries is described. The method includes eddy current inspection incorporating collection of data from multi-frequency eddy current signals. Phase analysis is used to combine the multi-frequency data to enhance the signal to noise ratio of the raw inspection image. The image is then reprocessed using a spatiotemporal filter to correlate with the frequency components of the eddy current flaw signal to separate signals associated with cracks and other flaws at edges (34) that would ordinarily be hidden by edge effect signals.

摘要翻译： 描述了一种用于对零件检测小裂纹（40）等异常现象具有复杂的几何形状的方法（32）。 该方法包括涡流探伤从多频涡流信号结合的数据的收集。 相分析用于多频数据组合以增强信号到原始检查图像的信噪比。 然后，图像是使用一个时空滤波器与涡流探伤信号，以在边缘处分离裂缝和其他缺陷相关联的信号（34）的频率分量相关联重新处理所做将通常由边缘效应信号被隐藏。

公开(公告)号：EP1674860A2

公开(公告)日：2006-06-28

申请号：EP05257839.0

申请日：2005-12-20

申请人： GENERAL ELECTRIC COMPANY

发明人： Wang, Changting ,  Plotnikov, Yuri Alexeyevich ,  Mcknight, William Stewart ,  Nath, Shridhar Champaknath ,  Gambrell, Gigi Olive ,  Togo, Mottito ,  Hennessy, William Andrew ,  Ertel, John William ,  Mandayam, Shyamsunder Tondanur

IPC分类号： G01N27/90

CPC分类号： G01N27/902

摘要： Several eddy current array probes (ECAP) with enhanced drive coil configurations are described. In one arrangement, an ECAP (10) includes a number of EC channels (12) and a number of drive coils (14). Each of the drive coils is provided for a respective one of the EC channels. The drive coils have alternating polarity with respect to neighboring drive coils. In another arrangement, an ECAP (40) for detecting flaws in a number of scanning and orientation configurations includes at least one substrate (32), a number of sense coils (16, 18) arranged on the substrate(s), and a drive coil (14) encompassing all of the sense coils. In another arrangement, an ECAP includes a substrate sense coils arranged in at least two rows, and at least one drive line. One drive line is provided for each pair of rows and disposed between the rows.

摘要翻译： 描述了具有增强的驱动线圈配置的几个涡流阵列探针（ECAP）。 在一种布置中，ECAP（10）包括多个EC通道（12）和多个驱动线圈（14）。 驱动线圈中的每一个为EC通道中的相应一个提供。 驱动线圈相对于相邻的驱动线圈具有交替的极性。 在另一种布置中，用于检测多个扫描和取向配置中的缺陷的ECAP（40）包括至少一个衬底（32），布置在衬底上的多个感测线圈（16,18）和驱动器 线圈（14）包围所有感测线圈。 在另一种布置中，ECAP包括布置成至少两行的衬底检测线圈和至少一条驱动线。 为每对行提供一条驱动线，并设置在行之间。

公开(公告)号：EP1521078A1

公开(公告)日：2005-04-06

申请号：EP04255940.1

申请日：2004-09-29

申请人： GENERAL ELECTRIC COMPANY

发明人： May, Andrew ,  Wang, Changting ,  Plotnikov, Yuri Alexeyevich

IPC分类号： G01N27/90

CPC分类号： G01N27/9046

摘要： In some aspects, the present invention provides a method for estimating at least one measurement/object property of a metal object. The method includes generating (102) a time-varying eddy current in a wall of the metal object utilizing a pulsed-signal transmitter. The method further includes measuring (104) the time-varying eddy current, fitting (106) the time-varying measured eddy current to a parameterized polynomial, and interpreting (108) the parameterized polynomial to determine one or more measurement/object properties of the metal object.

摘要翻译： 在一些方面，本发明提供一种用于估计金属物体的至少一个测量/物体特性的方法。 该方法包括利用脉冲信号发射器在金属物体的壁上产生（102）时变涡流。 该方法还包括测量（104）时变涡流，将随时间变化的测量的涡流拟合（106）到参数化多项式，并解释（108）参数化多项式以确定一个或多个测量/对象属性 金属物体。

公开(公告)号：EP2522994A1

公开(公告)日：2012-11-14

申请号：EP12167554.0

申请日：2012-05-10

申请人： GENERAL ELECTRIC COMPANY

发明人： Godbole, Mandar Diwakar ,  Wang, Changting ,  May, Andrzej Michal ,  Tralshawala, Nilesh ,  Faidi, Waseem Ibrahim

IPC分类号： G01N27/90

CPC分类号： G01N27/82 ,  G01N27/904 ,  G01R33/12

摘要： Inspection systems provided herein may include a drive coil (1502) capable of being excited to generate a substantially uniform magnetic field about an object (803, 804). The object (803, 804) includes a ferromagnetic adhesive (801) adhered thereto. The inspection systems may also include an array of sensor coils (1504) adapted to detect the magnetic field from the drive coil (1502) after the magnetic field interacts with the ferromagnetic adhesive (801) and to produce a voltage output (2012, 2026) corresponding to the detected magnetic field.

摘要翻译： 本文提供的检查系统可以包括能够被激发以围绕物体（803,804）产生基本上均匀的磁场的驱动线圈（1502）。 物体（803,804）包括粘附在其上的铁磁性粘合剂（801）。 检查系统还可以包括适于在磁场与铁磁性粘合剂（801）相互作用并且产生电压输出（2012,2026）之后检测来自驱动线圈（1502）的磁场的传感器线圈阵列（1504） 对应于检测到的磁场。

公开(公告)号：EP2056103B1

公开(公告)日：2011-07-20

申请号：EP08166999.6

申请日：2008-10-20

申请人： General Electric Company

发明人： Sun, Haiyan ,  Plotnikov, Yuri ,  Wang, Changting ,  Mcknight, William Stewart ,  Suh, Ui

IPC分类号： G01N27/90

CPC分类号： G01N27/9033 ,  Y10T29/4902

公开(公告)号：EP1990637A2

公开(公告)日：2008-11-12

申请号：EP08155344.8

申请日：2008-04-29

申请人： GENERAL ELECTRIC COMPANY

发明人： Wang, Changting ,  Nath, Shridhar Champaknath ,  Griffin, Weston Blaine ,  Fields, Michael Wayne ,  Hallman, Darren Lee ,  Al-Khalidy, Abdul Rahman Abdallah

IPC分类号： G01N27/90

CPC分类号： G01N27/9046 ,  G01N27/902

摘要： A method (60) for inspecting an internal cavity (44) in a part (12) is provided. The method (60) includes inserting (62) a probe (14) into the internal cavity (44). The method (60) also includes controlling (62) movement of the probe (14) using a defined scan path to scan the probe (14) over a region of interest in the internal cavity (44). The method (60) also includes applying (64) multiple multifrequency excitation signals to the probe (14) to generate a number of multifrequency response signals. The multifrequency excitation signals are applied (68) at multiple positions within the internal cavity (14). The method (60) further includes performing a multifrequency phase analysis on the multifrequency response signals to inspect the internal cavity (14).

摘要翻译： 提供了一种用于检查部件（12）中的内腔（44）的方法（60）。 方法（60）包括将探头（14）插入（62）到内腔（44）中。 方法（60）还包括使用限定的扫描路径来控制（62）探测器（14）的移动，以在内腔（44）中的感兴趣区域上扫描探针（14）。 方法（60）还包括向探头（14）应用（64）多个多频激励信号以产生多个多频响应信号。 多频激励信号在内腔（14）内的多个位置施加（68）。 方法（60）还包括对多频响应信号执行多频相分析以检查内腔（14）。