发明公开
EP2058766A2 Method and system for detection of concha and intertragal notch point in 3D undetailed ear impressions
审中-公开
Verfahren und System zur Erkennung von Concha- und Intertragal-Kerbpunkten in nicht detaillierten 3D-Ohaptressionen
- 专利标题： Method and system for detection of concha and intertragal notch point in 3D undetailed ear impressions
- 专利标题（中）： Verfahren und System zur Erkennung von Concha- und Intertragal-Kerbpunkten in nicht detaillierten 3D-Ohaptressionen
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申请号： EP08167772.6申请日： 2008-10-28
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公开(公告)号： EP2058766A2公开(公告)日： 2009-05-13
- 发明人: Melkisetoglu, Rupen , Zouhar, Alexander , Fang, Tong
- 申请人： Siemens Corporate Research, INC.
- 申请人地址： 755 College Road East Princeton, NJ 08540 US
- 专利权人： Siemens Corporate Research, INC.
- 当前专利权人： Siemens Corporate Research, INC.
- 当前专利权人地址： 755 College Road East Princeton, NJ 08540 US
- 代理机构： Clarke, Alison Clare
- 优先权： US984412P 20071101; US288216 20081017
- 主分类号： G06T17/20
- IPC分类号： G06T17/20
摘要：
A method and system for detecting the concha and intertragal notch in an undetailed 3D ear impression is disclosed. The concha is detected by searching vertical scan lines in a region surrounding the aperture using a two-pass method. The intertragal notch is detected based on a bottom contour of the 3D undetailed ear impression and a local coordinate system defined for the 3D undetailed ear impression.
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