发明公开
- 专利标题: VERFAHREN ZUM TESTEN EINER ELEKTRONIKEINHEIT
- 专利标题(英): Method for testing an electronic unit
- 专利标题(中): 检验方法的电子单元
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申请号: EP07820862.6申请日: 2007-10-02
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公开(公告)号: EP2069810A1公开(公告)日: 2009-06-17
- 发明人: FRÜHAUF, Dietmar , GRITTKE, Udo , HUMPERT, Axel , SCHÄUBLE, Harald
- 申请人: Endress+Hauser GmbH+Co. KG
- 申请人地址: Hauptstrasse 1 79689 Maulburg DE
- 专利权人: Endress+Hauser GmbH+Co. KG
- 当前专利权人: Endress+Hauser GmbH+Co. KG
- 当前专利权人地址: Hauptstrasse 1 79689 Maulburg DE
- 代理机构: Andres, Angelika Maria
- 优先权: DE102006047262 20061004
- 国际公布: WO2008040744 20080410
- 主分类号: G01R31/02
- IPC分类号: G01R31/02
摘要:
The invention relates to a method for testing an electronic unit (2), particularly an electronic unit (2) of a device for determining and/or monitoring a process variable, wherein the electronic unit (2) comprises a plurality of electric components. According to the invention, at least some of the electric components are combined in a group (5), to the group (5) a query signal is transmitted, the response signal from the group (5) is received, and the response signal is evaluated. Furthermore, the invention relates to a device for determining and/or monitoring a process variable.
公开/授权文献
- EP2069810B1 VERFAHREN ZUM TESTEN EINER ELEKTRONIKEINHEIT 公开/授权日:2016-09-07
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