发明公开
- 专利标题： ADVANCED DRUG DEVELOPMENT AND MANUFACTURING
- 专利标题（中）： X射线荧光分析法
-
申请号： EP07874491.9申请日： 2007-10-10
-
公开(公告)号： EP2084519A2公开(公告)日： 2009-08-05
- 发明人: BIRNBAUM, Eva, R. , KOPPISCH, Andrew, T. , BALDWIN, Sharon, M. , WARNER, Benjamin, P. , MCCLESKEY, Mark, T. , BERGER, Jennifer, A. , STEWART, Jeffrey, J. , HARRIS, Michael, N. , BURRELL, Anthony, K.
- 申请人： Los Alamos National Security, LLC , Caldera Pharmaceuticals, INC.
- 申请人地址： Los Alamos National Laboratory LC/IP, MS A187 Los Alamos, NM 87545 US
- 专利权人： Los Alamos National Security, LLC,Caldera Pharmaceuticals, INC.
- 当前专利权人： Los Alamos National Security, LLC,Caldera Pharmaceuticals, INC.
- 当前专利权人地址： Los Alamos National Laboratory LC/IP, MS A187 Los Alamos, NM 87545 US
- 代理机构： Albrecht, Thomas
- 优先权： US850594P 20061010
- 国际公布： WO2008127291 20081023
- 主分类号： G01N23/223
- IPC分类号： G01N23/223 ; G01T1/36 ; C12Q1/00
摘要：
X-ray fluorescence (XRF) spectrometry has been used for detecting binding events and measuring binding selectivities between chemicals and receptors. XRF may also be used for estimating the therapeutic index of a chemical, for estimating the binding selectivity of a chemical versus chemical analogs, for measuring post-translational modifications of proteins, and for drug manufacturing.
公开/授权文献
- EP2084519B1 X-RAY FLUORESCENCE ANALYSIS METHOD 公开/授权日：2012-08-01
信息查询
