发明公开
- 专利标题: Ion trap
- 专利标题(中): Ionenfalle
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申请号: EP09000834.3申请日: 2002-06-17
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公开(公告)号: EP2099058A2公开(公告)日: 2009-09-09
- 发明人: Zajfman, Daniel , Heber, Oded , Pedersen, Henrik , Rudich, Yinon , Sagi, Irit , Rappaport, Michael
- 申请人: Yeda Research And Development Company Limited
- 申请人地址: The Weizmann Institute of Science P.O. Box 95 76100 Rehovot IL
- 专利权人: Yeda Research And Development Company Limited
- 当前专利权人: Yeda Research And Development Company Limited
- 当前专利权人地址: The Weizmann Institute of Science P.O. Box 95 76100 Rehovot IL
- 代理机构: Casey, Lindsay Joseph
- 优先权: US883841 20010618
- 主分类号: H01J49/40
- IPC分类号: H01J49/40
摘要:
A charged particle trap for trapping of a plurality of charged particles. The trap includes first and second electrode mirrors (2,3) having a common optical axis (4), the mirrors being arranged in alignment at two extremities thereof. The mirrors are capable, when voltage is applied thereto, of creating respective electric fields defined by key field parameters. The electric fields are configured to reflect charged particles causing their oscillation between the mirrors. The plurality of charged particles is introduced into the trap, along the optical axis, as a beam (10) having pre-determined key beam parameters. The key field parameters for at least one of the mirrors are chosen such as to induce bunching among charged particles in the beam.
公开/授权文献
- EP2099058A3 Ion trap 公开/授权日:2009-12-02
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