发明公开
EP2103948A1 SIGNAL QUALITY MEASURING DEVICE, SPECTRUM MEASURING CIRCUIT, AND PROGRAM 审中-公开
SIGNALQUALITÄTS-MESSEINRICHTUNG,SPEKTRUM-MESSSCHALTUNG UND PROGRAMM

  • 专利标题: SIGNAL QUALITY MEASURING DEVICE, SPECTRUM MEASURING CIRCUIT, AND PROGRAM
  • 专利标题(中): SIGNALQUALITÄTS-MESSEINRICHTUNG,SPEKTRUM-MESSSCHALTUNG UND PROGRAMM
  • 申请号: EP07850815.7
    申请日: 2007-12-18
  • 公开(公告)号: EP2103948A1
    公开(公告)日: 2009-09-23
  • 发明人: NOSE, KoichiMIZUNO, Masayuki
  • 申请人: NEC Corporation
  • 申请人地址: 7-1 Shiba 5-chome Minato-ku Tokyo 108-8001 JP
  • 专利权人: NEC Corporation
  • 当前专利权人: NEC Corporation
  • 当前专利权人地址: 7-1 Shiba 5-chome Minato-ku Tokyo 108-8001 JP
  • 代理机构: Wenzel & Kalkoff
  • 优先权: JP2007000567 20070105; JP2007146818 20070601
  • 国际公布: WO2008081713 20080710
  • 主分类号: G01R19/00
  • IPC分类号: G01R19/00 G01R23/16
SIGNAL QUALITY MEASURING DEVICE, SPECTRUM MEASURING CIRCUIT, AND PROGRAM
摘要:
In the signal quality measurement device of the present invention, a spectrum measurement circuit (101) includes: an N-(where N is an integer equal or greater than 2) phase clock generation circuit (304) for supplying phase-modulated signals in which the phase of a clock signal is shifted by a phase modulation amount each time the settings of the phase modulation amount are switched; a mixer circuit (303) for taking the product of a measured signal that is supplied from a transmitter and the phase-modulated signals that are supplied from the N-phase clock generation circuit (304); an average value output circuit (305) for supplying an average voltage value of the output signal of the mixer circuit (303); a memory (307) for storing the average voltage value supplied from the average value output circuit (305) for each phase modulation amount of the N-phase clock generation circuit (304); and arithmetic unit (308) for using the average voltage value for each phase modulation amount of the N-phase clock generation circuit (304) that is stored in memory (307) to calculate the signal strength of the measured signal.
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