发明公开
EP2103948A1 SIGNAL QUALITY MEASURING DEVICE, SPECTRUM MEASURING CIRCUIT, AND PROGRAM
审中-公开
SIGNALQUALITÄTS-MESSEINRICHTUNG,SPEKTRUM-MESSSCHALTUNG UND PROGRAMM
- 专利标题: SIGNAL QUALITY MEASURING DEVICE, SPECTRUM MEASURING CIRCUIT, AND PROGRAM
- 专利标题(中): SIGNALQUALITÄTS-MESSEINRICHTUNG,SPEKTRUM-MESSSCHALTUNG UND PROGRAMM
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申请号: EP07850815.7申请日: 2007-12-18
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公开(公告)号: EP2103948A1公开(公告)日: 2009-09-23
- 发明人: NOSE, Koichi , MIZUNO, Masayuki
- 申请人: NEC Corporation
- 申请人地址: 7-1 Shiba 5-chome Minato-ku Tokyo 108-8001 JP
- 专利权人: NEC Corporation
- 当前专利权人: NEC Corporation
- 当前专利权人地址: 7-1 Shiba 5-chome Minato-ku Tokyo 108-8001 JP
- 代理机构: Wenzel & Kalkoff
- 优先权: JP2007000567 20070105; JP2007146818 20070601
- 国际公布: WO2008081713 20080710
- 主分类号: G01R19/00
- IPC分类号: G01R19/00 ; G01R23/16
摘要:
In the signal quality measurement device of the present invention, a spectrum measurement circuit (101) includes: an N-(where N is an integer equal or greater than 2) phase clock generation circuit (304) for supplying phase-modulated signals in which the phase of a clock signal is shifted by a phase modulation amount each time the settings of the phase modulation amount are switched; a mixer circuit (303) for taking the product of a measured signal that is supplied from a transmitter and the phase-modulated signals that are supplied from the N-phase clock generation circuit (304); an average value output circuit (305) for supplying an average voltage value of the output signal of the mixer circuit (303); a memory (307) for storing the average voltage value supplied from the average value output circuit (305) for each phase modulation amount of the N-phase clock generation circuit (304); and arithmetic unit (308) for using the average voltage value for each phase modulation amount of the N-phase clock generation circuit (304) that is stored in memory (307) to calculate the signal strength of the measured signal.
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