A method of measuring a coating thickness involves projecting a pattern of light on a surface (step A). A first reflection of the pattern of light is received by a first image capturing device. A second reflection of the pattern of light is received by an image capturing device which may be the same or a different image capturing device. The first reflection is compared with the second reflection (step B). A first data map of the surface is created by comparing the first reflection and the second reflection (step C). A coating is deposited on the surface (step D). A second data map of the surface with the coating is created by comparing reflections (step E). The first data map and the second data map are then compared to determine a thickness of the coating (step F). A system for carrying out the method is also disclosed.