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    Method for repeatable optical determination of object geometry dimensions and deviations
    2.
    发明公开
    Method for repeatable optical determination of object geometry dimensions and deviations 审中-公开
    一种用于对象的尺寸和几何的偏差的光学重复判定处理

    公开(公告)号：EP2023081A3

    公开(公告)日：2012-08-29

    申请号：EP08252565.0

    申请日：2008-07-28

    申请人： United Technologies Corporation

    发明人： Boyer, Jesse R. ,  Pearson, Jeffry K. ,  Meissner, Benjamin W. ,  Joyner, Randall W. ,  Romanelli, James

    IPC分类号： G01C11/06 ,  G01B11/245 ,  G01B11/25 ,  G01B21/04

    CPC分类号： G01C11/06 ,  G01B11/2504 ,  G01B11/2545

    摘要： A method for inspecting geometrical shapes of objects (11) to determine selected dimensions thereof based on data characterizing such objects obtained through stereoscopic photographs taken by a pair of cameras (14, 15)with fields of view intersecting to thereby provide a photographic event measurement volume that includes at least a portion of each of such objects (11) being photographed. The method involves using previously specified procedures to check on the cameras (14, 15) performance consistency in photographing from different positions, preparing the object (11) to be inspected including providing reference point targets thereon, scanning that object with the cameras (14, 15) from different camera pair positions, processing the resulting data to represent the scan basis geometrical shape of the object (11), and orient it to compare with the dimensional specifications therefor.

    Method for repeatable optical determination of object geometry dimensions and deviations
    3.
    发明公开
    Method for repeatable optical determination of object geometry dimensions and deviations 审中-公开
    一种用于对象的尺寸和几何的偏差的光学重复判定处理

    公开(公告)号：EP2023081A2

    公开(公告)日：2009-02-11

    申请号：EP08252565.0

    申请日：2008-07-28

    申请人： United Technologies Corporation

    发明人： Boyer, Jesse R. ,  Pearson, Jeffry K. ,  Meissner, Benjamin W. ,  Joyner, Randall W. ,  Romanelli, James

    IPC分类号： G01C11/06

    CPC分类号： G01C11/06 ,  G01B11/2504 ,  G01B11/2545

    摘要： A method for inspecting geometrical shapes of objects (11) to determine selected dimensions thereof based on data characterizing such objects obtained through stereoscopic photographs taken by a pair of cameras (14, 15)with fields of view intersecting to thereby provide a photographic event measurement volume that includes at least a portion of each of such objects (11) being photographed. The method involves using previously specified procedures to check on the cameras (14, 15) performance consistency in photographing from different positions, preparing the object (11) to be inspected including providing reference point targets thereon, scanning that object with the cameras (14, 15) from different camera pair positions, processing the resulting data to represent the scan basis geometrical shape of the object (11), and orient it to compare with the dimensional specifications therefor.

    摘要翻译： 一种用于检查物体（11），以确定的矿井选定维度的几何形状的方法及其基于数据与相交从而提供照相事件测量体积的视场表征通过一对相机（14,15）拍摄的立体照片获得检查对象 确实包括至少被拍照的每个搜索对象中的（11）的部分。 该方法包括使用先前指定的程序来检查摄像机（14，15）在从不同位置拍摄，制备所述对象（11）的性能一致性要被检查包括：提供参考点的目标在其上，扫描并与所述摄像头（14对象， 15）从不同摄象位置对中，处理所得到的数据来表示物体（11）的扫描基几何形状和定向它与尺寸规格为此比较。

    Method and system for locating a laser vibrometer during non-contact scanning
    4.
    发明公开
    Method and system for locating a laser vibrometer during non-contact scanning 有权
    Verfahren und System zur Positionierung eines Laservibrometerwährendeiner kontaktfreien Abtastung

    公开(公告)号：EP2515073A3

    公开(公告)日：2016-07-06

    申请号：EP12164749.9

    申请日：2012-04-19

    申请人： United Technologies Corporation

    发明人： Boyer, Jesse R. ,  Joyner, Randall W.

    IPC分类号： G01B11/16 ,  G01B11/25

    CPC分类号： G01B11/25 ,  G01B11/161 ,  G01B11/2545

    摘要： A method and system are provided for inspecting a surface of an object (14) with an optical scanner (16) and a laser vibrometer (18). The method includes the steps of: (a) mapping at least a portion of the object surface (12) using the optical scanner (16); (b) projecting abeam of light (32) from the laser vibrometer (18) onto the object surface (12) at a measurement point (68); (c) locating the measurement point (68) relative to the object surface (12) using the optical scanner (16); and (d) measuring a position of the object surface (12) using the laser vibrometer (18) to determine, for example, a deflection of the object surface (12).

    摘要翻译： 提供了一种用于使用光学扫描器（16）和激光振动计（18）检查物体（14）的表面的方法和系统。 该方法包括以下步骤：（a）使用光学扫描仪（16）映射对象表面（12）的至少一部分; （b）在测量点（68）将光（32）的光从激光振动计（18）投射到物体表面（12）上; （c）使用光学扫描器（16）相对于物体表面（12）定位测量点（68）; 以及（d）使用激光振动计（18）测量物体表面（12）的位置，以确定例如物体表面（12）的偏转。

    Method and system for locating a laser vibrometer during non-contact scanning
    5.
    发明公开
    Method and system for locating a laser vibrometer during non-contact scanning 有权
    方法和系统，用于使用光学扫描仪和激光振动计检查物体的表面

    公开(公告)号：EP2515073A2

    公开(公告)日：2012-10-24

    申请号：EP12164749.9

    申请日：2012-04-19

    申请人： United Technologies Corporation

    发明人： Boyer, Jesse R. ,  Joyner, Randall W.

    IPC分类号： G01B11/16

    CPC分类号： G01B11/25 ,  G01B11/161 ,  G01B11/2545

    摘要： A method and system are provided for inspecting a surface of an object (14) with an optical scanner (16) and a laser vibrometer (18). The method includes the steps of: (a) mapping at least a portion of the object surface (12) using the optical scanner (16); (b) projecting abeam of light (32) from the laser vibrometer (18) onto the object surface (12) at a measurement point (68); (c) locating the measurement point (68) relative to the object surface (12) using the optical scanner (16); and (d) measuring a position of the object surface (12) using the laser vibrometer (18) to determine, for example, a deflection of the object surface (12).

    摘要翻译： 提供了用于在光学扫描仪（16）和一个激光器（18）与检测振动计的表面到对象（14）的方法和系统。 该方法包括的步骤：（a）的映射至少使用光学扫描仪（16）中的物体表面（12）的一部分; 在测量点从所述激光振动计（18）到物体表面（12）（B）的光（32）的正横投射（68）; （C）定位所述测量点（68）相对于使用光学扫描仪（16）中的物体表面（12）; 及（d）使用所述激光振动计（18），以确定的矿，例如，在物体表面（12）的偏转测量物体表面（12）的位置。

    Method and system for measuring a coating thickness
    6.
    发明公开
    Method and system for measuring a coating thickness 审中-公开
    Verfahren und System zur Messung der Dicke einer Beschichtung

    公开(公告)号：EP2131144A1

    公开(公告)日：2009-12-09

    申请号：EP09250805.0

    申请日：2009-03-23

    申请人： United Technologies Corporation

    发明人： Boyer, Jesse R. ,  Joyner, Randall W. ,  Allocca, Gene P. ,  Pearson, Jeffry K.

    IPC分类号： G01B11/06 ,  G01B11/25 ,  B28B17/00

    CPC分类号： G01B11/0683 ,  B05B12/084 ,  G01B11/2545

    摘要： A method of measuring a coating thickness involves projecting a pattern of light on a surface (step A). A first reflection of the pattern of light is received by a first image capturing device. A second reflection of the pattern of light is received by an image capturing device which may be the same or a different image capturing device. The first reflection is compared with the second reflection (step B). A first data map of the surface is created by comparing the first reflection and the second reflection (step C). A coating is deposited on the surface (step D). A second data map of the surface with the coating is created by comparing reflections (step E). The first data map and the second data map are then compared to determine a thickness of the coating (step F). A system for carrying out the method is also disclosed.

    摘要翻译： 测量涂层厚度的方法包括将光图案投影在表面上（步骤A）。 光的图案的第一反射由第一图像捕获装置接收。 光图案的第二反射由可以是相同或不同的图像捕获装置的图像捕获装置接收。 将第一反射与第二反射进行比较（步骤B）。 通过比较第一反射和第二反射来创建表面的第一数据图（步骤C）。 在表面上沉积涂层（步骤D）。 通过比较反射来创建具有涂层的表面的第二数据图（步骤E）。 然后比较第一数据图和第二数据图以确定涂层的厚度（步骤F）。 还公开了一种用于执行该方法的系统。