发明公开
- 专利标题: MICROSCOPY SUPPORT STRUCTURES
- 专利标题(中): 观察支持结构
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申请号: EP08769383申请日: 2008-05-09
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公开(公告)号: EP2153461A4公开(公告)日: 2012-03-07
- 发明人: DAMIANO JOHN JR , MICK STEPHEN E , NACKASHI DAVID P
- 申请人: PROTOCHIPS INC
- 专利权人: PROTOCHIPS INC
- 当前专利权人: PROTOCHIPS INC
- 优先权: US91691607 2007-05-09; US97438407 2007-09-21
- 主分类号: H01J37/20
- IPC分类号: H01J37/20 ; H01J37/26 ; H01L21/3065 ; H01L21/66
摘要:
Electron microscope support structures and methods of making and using same. The support structures are generally constructed using semiconductor materials and semiconductor manufacturing processes. The temperature of the support structure may be controlled and/or gases or liquids may be confined in the observation region for reactions and/or imaging.
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