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1.发明公开SPECIMEN HOLDER USED FOR MOUNTING SAMPLES IN ELECTRON MICROSCOPES 审中-公开ELEKTRONENMIKROSKOPEN的PRÄPARATHALTERMIT VERWENDUNG ZUR BEFESTIGUNG VON PROBEN
公开(公告)号：EP2260286A4
公开(公告)日：2012-04-11
申请号：EP09722296
申请日：2009-03-17
申请人： PROTOCHIPS INC
CPC分类号： H01J37/20 , G01N1/28 , H01J2237/2007 , H01J2237/2008
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2.发明公开A METHOD FOR FORMING AN ELECTRICAL CONNECTION TO A SAMPLE SUPPORT IN AN ELECTRON MICROSCOPE HOLDER 审中-公开制造用于样本载体的电连接器在电子显微镜HOLDER
公开(公告)号：EP2920807A4
公开(公告)日：2016-07-13
申请号：EP13855383
申请日：2013-11-13
申请人： PROTOCHIPS INC
发明人： DAMIANO JR JOHN , NACKASHI DAVID P , GARDINER DANIEL STEPHEN , WALDEN II FRANKLIN STAMPLEY , CARPENTER WILLIAM BRADFORD
CPC分类号： H01R13/24 , H01J37/20 , H01J37/26 , H01J2237/2003 , H01J2237/2007 , H01J2237/2008 , H01J2237/206 , H01R12/721 , H01R12/79
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公开(公告)号：EP2130086A4
公开(公告)日：2012-03-14
申请号：EP08731074
申请日：2008-02-29
申请人： PROTOCHIPS INC
发明人： DAMIANO JOHN , MICK STEPHEN E , NACKASHI DAVID P
CPC分类号： G02B21/34 , B01L3/508 , B01L2300/0851 , G01N1/312 , G01N1/36 , G01N1/42 , H01J37/20 , H01J2237/2003
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公开(公告)号：EP2153461A4
公开(公告)日：2012-03-07
申请号：EP08769383
申请日：2008-05-09
申请人： PROTOCHIPS INC
IPC分类号： H01J37/20 , H01J37/26 , H01L21/3065 , H01L21/66
CPC分类号： H01J37/20 , H01J37/26 , H01J37/261 , H01J2237/188 , H01J2237/2001 , H01J2237/2002 , H01J2237/2003 , H01J2237/2007 , H01J2237/2008 , H01J2237/2602 , H01J2237/28 , H01J2237/2802
摘要： Electron microscope support structures and methods of making and using same. The support structures are generally constructed using semiconductor materials and semiconductor manufacturing processes. The temperature of the support structure may be controlled and/or gases or liquids may be confined in the observation region for reactions and/or imaging.
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5.发明公开ELECTRON MICROSCOPE SAMPLE HOLDER FOR FORMING A GAS OR LIQUID CELL WITH TWO SEMICONDUCTOR DEVICES 有权电子试样夹持器用于形成气体或液体池，两个半导体器件
公开(公告)号：EP2601669A4
公开(公告)日：2015-06-03
申请号：EP11815204
申请日：2011-08-02
申请人： PROTOCHIPS INC
CPC分类号： H01J37/26 , H01J37/16 , H01J37/18 , H01J37/20 , H01J37/29 , H01J37/30 , H01J2237/2002 , H01J2237/2003 , H01J2237/2007
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公开(公告)号：EP2240811A4
公开(公告)日：2012-09-05
申请号：EP08868958
申请日：2008-12-22
申请人： PROTOCHIPS INC
发明人： MICK STEPHEN E , DAMIANO JOHN , NACKASHI DAVID P
CPC分类号： H01J37/20 , G02B21/30 , H01J37/28 , H01J2237/2007 , H01J2237/2008
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公开(公告)号：EP2095098A4
公开(公告)日：2012-09-05
申请号：EP07854679
申请日：2007-11-16
申请人： PROTOCHIPS INC
IPC分类号： G01N23/225 , H01J37/20
CPC分类号： G01N23/046 , B82Y10/00 , B82Y30/00 , B82Y40/00 , G01N27/06 , G01N27/302 , G01N27/3335 , G01N27/4167 , G01N2223/419 , H01J37/20 , H01J2237/26 , H01J2237/28 , Y10S436/805 , Y10S436/809 , Y10T436/25
摘要： A sample support structure comprising a sample support manufactured from a semiconductor material and having one or more openings therein. Methods of making and using the sample support structure.
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