发明公开
- 专利标题: METHOD AND SYSTEM FOR OPTICALLY INSPECTING PARTS
- 专利标题(中): 方法和系统部件的光学检测
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申请号: EP08797734.4申请日: 2008-08-13
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公开(公告)号: EP2203711A1公开(公告)日: 2010-07-07
- 发明人: NYGAARD, Michael, G. , NYGAARD, Gregory, M. , NYGAARD, George, M. , SPALDING, John, D.
- 申请人: GII Acquisition, LLC DBA General Inspection, LLC
- 申请人地址: 10585 Enterprise Drive Davisburg, MI 48350 US
- 专利权人: GII Acquisition, LLC DBA General Inspection, LLC
- 当前专利权人: GII Acquisition, LLC DBA General Inspection, LLC
- 当前专利权人地址: 10585 Enterprise Drive Davisburg, MI 48350 US
- 代理机构: Maggs, Michael Norman
- 优先权: US977117 20071023
- 国际公布: WO2009055118 20090430
- 主分类号: G01B11/00
- IPC分类号: G01B11/00
摘要:
A method and system for optically inspecting parts are provided. The method includes the step of supporting a part along a measurement axis. The method includes scanning the part with an array of spaced planes of radiation so that the part occludes each of the planes of radiation at spaced locations along the axis to create a corresponding array of unobstructed planar portions of the planes of radiation. Each of the unobstructed planar portions contains an amount of radiation which is representative of a respective geometric dimension of the part. The method still further includes measuring the amount of radiation present in each of the unobstructed planar portions to obtain measurement signals. The method includes processing the measurement signals to obtain raw data. The method further includes providing calibration data and processing the calibration data and the raw data to obtain measurements of the part.
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