公开(公告)号：EP2823289A1

公开(公告)日：2015-01-14

申请号：EP13757558.5

申请日：2013-03-01

申请人： GII Acquisition, LLC DBA General Inspection, LLC

发明人： NYGAARD, Michael, G. ,  NYGAARD, Gregory, M.

IPC分类号： G01N21/952

CPC分类号： G01N21/8851 ,  G01N21/9515 ,  G01N21/952 ,  G01N2201/0415 ,  G01N2201/102

摘要： A high-speed, 3-D method and system for optically inspecting parts are provided. The system includes a part transfer subsystem including a transfer mechanism adapted to support a part at a loading station and transfer the supported part from the loading station to an inspection station at which the part has a predetermined position and orientation for inspection. The system also includes an illumination assembly to simultaneously illuminate an end surface of the part and a peripheral surface of the part. The system further includes a lens and detector assembly to form an optical image of the illuminated end surface and an optical image of the illuminated peripheral surface of the part and to detect the optical images. The system still further includes a processor to process the detected optical images to obtain an end view of the part and a 3-D panoramic view of the peripheral surface of the part.

公开(公告)号：EP2203711A1

公开(公告)日：2010-07-07

申请号：EP08797734.4

申请日：2008-08-13

申请人： GII Acquisition, LLC DBA General Inspection, LLC

发明人： NYGAARD, Michael, G. ,  NYGAARD, Gregory, M. ,  NYGAARD, George, M. ,  SPALDING, John, D.

IPC分类号： G01B11/00

CPC分类号： G01B11/2433 ,  G01B11/2425 ,  G01B11/245

摘要： A method and system for optically inspecting parts are provided. The method includes the step of supporting a part along a measurement axis. The method includes scanning the part with an array of spaced planes of radiation so that the part occludes each of the planes of radiation at spaced locations along the axis to create a corresponding array of unobstructed planar portions of the planes of radiation. Each of the unobstructed planar portions contains an amount of radiation which is representative of a respective geometric dimension of the part. The method still further includes measuring the amount of radiation present in each of the unobstructed planar portions to obtain measurement signals. The method includes processing the measurement signals to obtain raw data. The method further includes providing calibration data and processing the calibration data and the raw data to obtain measurements of the part.