发明公开
EP2257143A1 SOLDER CONNECTING METHOD, ELECTRONIC DEVICE AND METHOD FOR MANUFACTURING SAME 审中-公开
LÖTVERBINDUNGSVERFAHREN,ELEKTRONISCHE VORRICHTUNG UND HERSTELLUNGSVERFAHRENDAFÜR

  • 专利标题: SOLDER CONNECTING METHOD, ELECTRONIC DEVICE AND METHOD FOR MANUFACTURING SAME
  • 专利标题(中): LÖTVERBINDUNGSVERFAHREN,ELEKTRONISCHE VORRICHTUNG UND HERSTELLUNGSVERFAHRENDAFÜR
  • 申请号: EP09715856.2
    申请日: 2009-02-24
  • 公开(公告)号: EP2257143A1
    公开(公告)日: 2010-12-01
  • 发明人: MEURA, Toru
  • 申请人: Sumitomo Bakelite Co., Ltd.
  • 申请人地址: 5-8 Higashi-Shinagawa 2-chome Shinagawa-ku Tokyo 140-0002 JP
  • 专利权人: Sumitomo Bakelite Co., Ltd.
  • 当前专利权人: Sumitomo Bakelite Co., Ltd.
  • 当前专利权人地址: 5-8 Higashi-Shinagawa 2-chome Shinagawa-ku Tokyo 140-0002 JP
  • 代理机构: Vossius, Corinna
  • 优先权: JP2008050628 20080229
  • 国际公布: WO2009107357 20090903
  • 主分类号: H05K3/34
  • IPC分类号: H05K3/34 H05K3/28 H05K3/32 H05K3/36
SOLDER CONNECTING METHOD, ELECTRONIC DEVICE AND METHOD FOR MANUFACTURING SAME
摘要:
The method for providing the solder connection of the present invention is a method for providing a solder connection, which electrically connects a first electronic component having a solder bump to a second electronic component having a protruded electrode to provide electrical connection between the first solder bump and the protruded electrode, wherein a relation of: A + B > C is satisfied, where a height of the first solder bump from one surface of the first electronic component is presented as A [µm], a height of the protruded electrode before the compressive deformation from one surface of the second electronic component is presented as B [µm], and a thickness of the adhesive agent layer is presented as C [µm], and further comprising: disposing the adhesive agent layer in the first electronic component; and deforming the first solder bump and the protruded electrode and providing a contact of the above-described protruded electrode with the above-described first solder bump, so that the sum of the height A [µm] of the first the solder bump and the height B [µm] of the above-described protruded electrode is substantially equivalent to the thickness C [µm] of the above-described adhesive agent layer.
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