发明授权
- 专利标题: APPARATUS FOR MEASUREMENT OF BEAM ANGLE IN ION IMPLANTATION
- 专利标题(中): DEVICE梁角度测量离子注入
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申请号: EP09788820.0申请日: 2009-06-23
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公开(公告)号: EP2304765B1公开(公告)日: 2012-07-04
- 发明人: MITCHELL, Robert , VANDERBERG, Bo
- 申请人: Axcelis Technologies, Inc.
- 申请人地址: 108 Cherry Hill Drive Beverly, MA 01915 US
- 专利权人: Axcelis Technologies, Inc.
- 当前专利权人: Axcelis Technologies, Inc.
- 当前专利权人地址: 108 Cherry Hill Drive Beverly, MA 01915 US
- 代理机构: Treeby, Philip David William
- 优先权: US176748 20080721
- 国际公布: WO2010011252 20100128
- 主分类号: H01J37/317
- IPC分类号: H01J37/317 ; H01J37/147 ; H01J37/304
摘要:
An ion beam angle detection apparatus (440), comprising a linear drive assembly (460) fixedly attached to a moveable profiler assembly (450), wherein the profiler assembly comprises, a profiler having a profiler aperture (454) formed within a profiler top plate (455) and a profiler sensor assembly, a moveable angle mask assembly (446) comprising a moveable angle mask with a mask aperture (448), wherein the angle mask assembly is non-fixedly attached to the profiler assembly, the mask aperture is movable relative to the profiler aperture by energizing an mask linear drive (464) fixedly attached to the profiler assembly and the profiler aperture is movable through a length greater than the elongated length of the ion beam (456).
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