发明公开
EP2416249A1 SELF-TESTING APPARATUS AND METHOD FOR PHASE ADJUSTMENT CIRCUIT 有权
用于相位调整电路的自测试设备和方法

  • 专利标题: SELF-TESTING APPARATUS AND METHOD FOR PHASE ADJUSTMENT CIRCUIT
  • 专利标题(中): 用于相位调整电路的自测试设备和方法
  • 申请号: EP09842570.5
    申请日: 2009-03-31
  • 公开(公告)号: EP2416249A1
    公开(公告)日: 2012-02-08
  • 发明人: NAKAYAMA, HiroshiICHIMIYA, JunjiITOU, DaisukeITOZAWA, Shintaro
  • 申请人: Fujitsu Limited
  • 申请人地址: 1-1, Kamikodanaka 4-chome Nakahara-ku Kawasaki-shi, Kanagawa 211-8588 JP
  • 专利权人: Fujitsu Limited
  • 当前专利权人: Fujitsu Limited
  • 当前专利权人地址: 1-1, Kamikodanaka 4-chome Nakahara-ku Kawasaki-shi, Kanagawa 211-8588 JP
  • 代理机构: Ward, James Norman
  • 国际公布: WO2010113213 20101007
  • 主分类号: G06F11/22
  • IPC分类号: G06F11/22
SELF-TESTING APPARATUS AND METHOD FOR PHASE ADJUSTMENT CIRCUIT
摘要:
A signal inversion unit inverts an adjustment pattern signal input as received data. A clock adjustment control circuit acquires a first TAP value adjusted and obtained when a phase adjusting operation is performed on a clock adjustment circuit in a state in which the adjustment pattern signal is not inverted, a first detection frequency of the adjustment pattern signal in a runtime of the operation, a second TAP value adjusted and obtained when the phase adjusting operation is performed in a state in which the adjustment pattern signal is inverted by the signal inversion unit, and a second detection frequency of the adjustment pattern signal in the runtime of the operation. A controller tests an operating state of the phase adjusting operation based on the first and second TAP values and the first and second detection frequencies of the adjustment pattern obtained by the clock adjustment control circuit.
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