发明公开
- 专利标题: CALIBRATION OF DIFFERENTIAL PHASE-CONTRAST IMAGING SYSTEMS
- 专利标题(中): 标定不同相衬图像系统
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申请号: EP10807737.1申请日: 2010-12-08
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公开(公告)号: EP2509487A1公开(公告)日: 2012-10-17
- 发明人: VOGTMEIER, Gereon , ENGEL, Klaus Jürgen , GELLER, Dieter , KOEHLER, Thomas , ROESSL, Ewald
- 申请人: Koninklijke Philips Electronics N.V. , Philips Intellectual Property & Standards GmbH
- 申请人地址: Groenewoudseweg 1 5621 BA Eindhoven NL
- 专利权人: Koninklijke Philips Electronics N.V.,Philips Intellectual Property & Standards GmbH
- 当前专利权人: Koninklijke Philips Electronics N.V.,Philips Intellectual Property & Standards GmbH
- 当前专利权人地址: Groenewoudseweg 1 5621 BA Eindhoven NL
- 代理机构: Damen, Daniel Martijn
- 优先权: EP09178691 20091210
- 国际公布: WO2011070521 20110616
- 主分类号: A61B1/00
- IPC分类号: A61B1/00
摘要:
The present invention relates to an X-ray imaging system and a method for differential phase—contrast imaging of an object. To improve calibration of differential phase—contrast imaging systems and the alignment of the gratings an X-ray imaging system is provided that comprises an X-ray emitting arrangement providing at least partially coherent X-ray radiation and an X-ray detection arrangement comprising a phase-shift diffraction grating, a phase analyzer grating, and an X-ray image detector, all arranged along an optical axis. For stepping, the gratings and/or the X-ray emitting arrangement are provided with at least two actuators arranged opposite to each other with reference to the optical axis. For calibration, calibration projections are acquired without an object, wherein, the emitted X-ray radiation or one of the gratings is stepwise displaced with a calibration displacement value. For examination, measurement projections are acquired with an object, wherein the emitted X-ray radiation or one of the gratings is stepwise displaced with a measurement, a calibration projection is associated to each of the measurement projections by registering the latter with the calibration projections.
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