发明公开
EP2527785A1 Method and device for flatness measurement
审中-公开
Verfahren und Vorrichtung zur Ebenheitsmessung
- 专利标题： Method and device for flatness measurement
- 专利标题（中）： Verfahren und Vorrichtung zur Ebenheitsmessung
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申请号： EP11004191.0申请日： 2011-05-20
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公开(公告)号： EP2527785A1公开(公告)日： 2012-11-28
- 发明人: Milling, Oliver
- 申请人： Tata Steel UK Limited
- 申请人地址： 30 Millbank London SW1P 4WY GB
- 专利权人： Tata Steel UK Limited
- 当前专利权人： Tata Steel UK Limited
- 当前专利权人地址： 30 Millbank London SW1P 4WY GB
- 代理机构： Blauw, Frans Gerard
- 主分类号： G01B11/30
- IPC分类号： G01B11/30 ; E01C23/00 ; G01B5/20 ; G01B5/207 ; G01B5/28
摘要：
The invention relates to a device and method for flatness measurement of a surface wherein the device comprises a frame, at least one distance sensor connected to the frame, a control unit for the at least one distance sensor and a data processing unit for processing data from the at least one distance sensor. The deviation of flatness is determined by taking a number of measurements over a certain length and determining maximum variation from a straight line.
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