The present invention relates to a test apparatus for a test and connection apparatus arrangement, having a test unit which comprises a connecting unit that has a pin element for disconnecting an electrical connection and also has two first measuring connections, wherein two electrically conductive contact plates are arranged on the pin element, said contact plates each being electrically conductively connected to one of the two first measuring connections, wherein the measuring connections are arranged on that side of the test unit which is opposite the pin element, wherein the measuring connections are arranged at an angle to one another and/or vertically offset in relation to one another. The present invention also relates to a test apparatus having at least two test units which each comprise a connecting unit having a pin element and two first measuring connections, wherein the test units and/or the connecting units are arranged so as to be vertically offset in relation to one another. The present invention also relates to a test and connection apparatus arrangement having a test apparatus of this kind and a connection apparatus into which the test apparatus can be plugged.