发明公开
EP2717046A1 METHOD FOR ATTRIBUTING PEAKS, ATTRIBUTION PROGRAM, AND ATTRIBUTION DEVICE 审中-公开
VERFAHREN ZURZENZUNG VON SPITZENWERTEN,ZUORDNUNGSPROGRAMM UND ZUORDNUNGSVORRICHTUNG

  • 专利标题: METHOD FOR ATTRIBUTING PEAKS, ATTRIBUTION PROGRAM, AND ATTRIBUTION DEVICE
  • 专利标题(中): VERFAHREN ZURZENZUNG VON SPITZENWERTEN,ZUORDNUNGSPROGRAMM UND ZUORDNUNGSVORRICHTUNG
  • 申请号: EP12791980.1
    申请日: 2012-05-31
  • 公开(公告)号: EP2717046A1
    公开(公告)日: 2014-04-09
  • 发明人: MORI, YoshikazuNODA, KeiichiMAKINO, Bunsho
  • 申请人: TSUMURA & CO.
  • 申请人地址: 2-17-11, Akasaka Minato-ku Tokyo 107-8521 JP
  • 专利权人: TSUMURA & CO.
  • 当前专利权人: TSUMURA & CO.
  • 当前专利权人地址: 2-17-11, Akasaka Minato-ku Tokyo 107-8521 JP
  • 代理机构: Oppermann, Frank
  • 优先权: JP2011123846 20110601
  • 国际公布: WO2012164952 20121206
  • 主分类号: G01N30/86
  • IPC分类号: G01N30/86 G01N30/88
METHOD FOR ATTRIBUTING PEAKS, ATTRIBUTION PROGRAM, AND ATTRIBUTION DEVICE
摘要:
A peak assigning apparatus 1 for assigning peaks of a FP configured by peaks and retention time points of the peaks detected from a chromatogram of a multicomponent material, capable of contributing to improvement of the accuracy and efficiency of evaluation of an evaluation target, includes a peak pattern preparing part 7 preparing a peak pattern for each peak of the target FP and a reference FP that comprises n+1 peaks including n peaks being present on at least one of sides located in front and in the rear of each peak in a time axis direction, and a peak assigning part 9 specifying the peaks corresponding to each other by comparison of the peak patterns.
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