发明公开
EP2717046A1 METHOD FOR ATTRIBUTING PEAKS, ATTRIBUTION PROGRAM, AND ATTRIBUTION DEVICE
审中-公开
VERFAHREN ZURZENZUNG VON SPITZENWERTEN,ZUORDNUNGSPROGRAMM UND ZUORDNUNGSVORRICHTUNG
- 专利标题: METHOD FOR ATTRIBUTING PEAKS, ATTRIBUTION PROGRAM, AND ATTRIBUTION DEVICE
- 专利标题(中): VERFAHREN ZURZENZUNG VON SPITZENWERTEN,ZUORDNUNGSPROGRAMM UND ZUORDNUNGSVORRICHTUNG
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申请号: EP12791980.1申请日: 2012-05-31
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公开(公告)号: EP2717046A1公开(公告)日: 2014-04-09
- 发明人: MORI, Yoshikazu , NODA, Keiichi , MAKINO, Bunsho
- 申请人: TSUMURA & CO.
- 申请人地址: 2-17-11, Akasaka Minato-ku Tokyo 107-8521 JP
- 专利权人: TSUMURA & CO.
- 当前专利权人: TSUMURA & CO.
- 当前专利权人地址: 2-17-11, Akasaka Minato-ku Tokyo 107-8521 JP
- 代理机构: Oppermann, Frank
- 优先权: JP2011123846 20110601
- 国际公布: WO2012164952 20121206
- 主分类号: G01N30/86
- IPC分类号: G01N30/86 ; G01N30/88
摘要:
A peak assigning apparatus 1 for assigning peaks of a FP configured by peaks and retention time points of the peaks detected from a chromatogram of a multicomponent material, capable of contributing to improvement of the accuracy and efficiency of evaluation of an evaluation target, includes a peak pattern preparing part 7 preparing a peak pattern for each peak of the target FP and a reference FP that comprises n+1 peaks including n peaks being present on at least one of sides located in front and in the rear of each peak in a time axis direction, and a peak assigning part 9 specifying the peaks corresponding to each other by comparison of the peak patterns.
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