A method for feeding data to a function (46) for a control device is presented. In said method, system measurements (34) are performed at different measurement points on a test stand, and a global data-based model (38) is established on the basis of the obtained measured values. Virtual measurements simulating real measurements on the test stand are performed on the global data-based model (38), uncertainties about virtual measured values of the virtual measurements are determined in the global data-based model (38), and said uncertainties about the virtual measured values are taken into account when feeding data to the function (46) for the control device.