发明公开
EP2830079A1 Bimetal unit, trip unit, circuit breaker, series of circuit breakers, and method for calibrating circuit breaker
有权
双金属,跳闸单元,断路器,断路器系列和用于校准断路器方法
- 专利标题: Bimetal unit, trip unit, circuit breaker, series of circuit breakers, and method for calibrating circuit breaker
- 专利标题(中): 双金属,跳闸单元,断路器,断路器系列和用于校准断路器方法
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申请号: EP13178231.0申请日: 2013-07-26
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公开(公告)号: EP2830079A1公开(公告)日: 2015-01-28
- 发明人: Chora de la Garza, Rodrigo , Garcia Tovar, Ivan Alejandro , Hurtado Meza, Francisco Javier , Tellez Trevino, Dariel
- 申请人: Siemens Aktiengesellschaft
- 申请人地址: Wittelsbacherplatz 2 80333 München DE
- 专利权人: Siemens Aktiengesellschaft
- 当前专利权人: Siemens Aktiengesellschaft
- 当前专利权人地址: Wittelsbacherplatz 2 80333 München DE
- 主分类号: H01H37/20
- IPC分类号: H01H37/20 ; H01H71/74 ; H01H61/02 ; H01H71/16
摘要:
The invention relates to a bimetal unit (1) for a circuit breaker, the bimetal unit (1) including a bimetal element (2) for releasing a trip mechanism of the circuit breaker. The bimetal element (2) is surrounded, in particular coaxially surrounded, by a ferrous ring (4) and a copper coil (5) wound around the ferrous ring (4). The ferrous ring (4) and copper coil (5) provide a compensation device which produces additional heat and, as a result, stronger bending to the bimetal element (2) when a current flows through the same bimetal element (2). The invention is useful to employ bimetal element (2) adapted for higher-rated current in a circuit breaker of lower-rated current as bimetal element (2) exhibits similar bending behavior as in higher-rated circuit breaker. This enhances calibration and reduces manufacturing costs. The invention also relates to a trip unit, a circuit breaker, a series of circuit breakers, and a method for calibrating a circuit breaker, each employing the bimetal unit (1).
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