发明公开
EP2831883A1 SELECTED WORD LINE DEPENDENT SELECT GATE DIFFUSION REGION VOLTAGE DURING PROGRAMNMING
有权
的选定字线相依扩散面积功率为选定的门编程过程中
- 专利标题: SELECTED WORD LINE DEPENDENT SELECT GATE DIFFUSION REGION VOLTAGE DURING PROGRAMNMING
- 专利标题(中): 的选定字线相依扩散面积功率为选定的门编程过程中
-
申请号: EP12798122.3申请日: 2012-11-27
-
公开(公告)号: EP2831883A1公开(公告)日: 2015-02-04
- 发明人: LAI, Chun-Hung , SATO, Shinji , LEE, Shih-Chung , HEMINK, Gerrit Jan
- 申请人: SanDisk Technologies Inc.
- 申请人地址: Two Legacy Town Center 6900 North Dallas Parkway Plano, Texas 75024 US
- 专利权人: SanDisk Technologies Inc.
- 当前专利权人: SanDisk Technologies Inc.
- 当前专利权人地址: Two Legacy Town Center 6900 North Dallas Parkway Plano, Texas 75024 US
- 代理机构: Tothill, John Paul
- 优先权: US201213430494 20120326
- 国际公布: WO2013147936 20131003
- 主分类号: G11C11/56
- IPC分类号: G11C11/56 ; G11C16/04 ; G11C16/10
摘要:
Methods and devices for operating non-volatile storage are disclosed. One or more programming conditions depend on the location of the word line that is selected for programming. Applying a selected word line dependent program condition may reduce or eliminate program disturb. The voltage applied to a common source line may depend on the location of the word line that is selected for programming. This may prevent or reduce punch-through conduction, which may prevent or reduce program disturb. The voltage applied to bit lines of unselected NAND strings may depend on the location of the word line that is selected for programming. This may prevent or reduce punch-through conduction.
公开/授权文献
信息查询