发明公开
EP2889756A1 Systems, apparatuses, and methods for vector bit test
审中-公开
Systeme，Vorrichtungen und Verfahren zurVektorbitprüfung
- 专利标题： Systems, apparatuses, and methods for vector bit test
- 专利标题（中）： Systeme，Vorrichtungen und Verfahren zurVektorbitprüfung
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申请号： EP14194109.6申请日： 2014-11-20
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公开(公告)号： EP2889756A1公开(公告)日： 2015-07-01
- 发明人: Uliel, Tal , Ould-Ahmed-Vall, Elmoustapha , Valentine, Robert , Willhalm, Thomas
- 申请人： Intel Corporation
- 申请人地址： 2200 Mission College Boulevard Santa Clara, CA 95054 US
- 专利权人： Intel Corporation
- 当前专利权人： Intel Corporation
- 当前专利权人地址： 2200 Mission College Boulevard Santa Clara, CA 95054 US
- 代理机构： Hufton, David Alan
- 优先权： US201314142467 20131227
- 主分类号： G06F9/30
- IPC分类号： G06F9/30
摘要：
Systems, methods, and apparatuses for vector bit test are described. In some embodiments, a vector bit test instruction is executed to shift each packed data element of a first source by a number of bits indicated by a corresponding packed data element of a second source, and store consecutive bit values from each packed data element of the first source at the identified bit positions of a corresponding packed data element of a destination.
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