发明授权
- 专利标题: Circuit for detecting phase shift applied to an RF signal
- 专利标题(中): 用于检测施加到RF信号的相移的电路
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申请号: EP14290234.5申请日: 2014-08-07
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公开(公告)号: EP2983290B1公开(公告)日: 2017-12-20
- 发明人: Tourret, Jean-Robert
- 申请人: NXP B.V.
- 申请人地址: High Tech Campus 60 5656 AG Eindhoven NL
- 专利权人: NXP B.V.
- 当前专利权人: NXP B.V.
- 当前专利权人地址: High Tech Campus 60 5656 AG Eindhoven NL
- 代理机构: Miles, John Richard
- 主分类号: H03H17/08
- IPC分类号: H03H17/08 ; H05B6/70 ; H05B6/72 ; H05B6/68 ; H03D13/00
摘要:
An RF circuit and method for detecting the amount of phase shift applied to an RF signal. An RF heating apparatus including the RF circuit. The RF circuit includes a phase shifter operable to apply a phase shift to a reference signal to produce a phase shifted reference signal. The RF circuit also includes a phase detector operable to detect a phase difference between the phase shifted RF signal and the phase shifted reference signal. The phase detector has a reduced input range at a frequency of the phase shifted RF signal. The RF circuit further includes a controller operable to control the phase shifter to set the phase of the phase shifted reference signal so that the phase difference between the phase shifted RF signal and the phase shifted reference signal falls within the reduced input range of the phase detector.
公开/授权文献
- EP2983290A1 Circuit for detecting phase shift applied to an RF signal 公开/授权日:2016-02-10
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