发明公开
- 专利标题: FREQUENCY CHARACTERISTIC ADJUSTING JIG, ANTENNA TESTING APPARATUS AND ANTENNA TESTING METHOD, AND LOOP ANTENNA
- 专利标题(中): 天安门广场天安门广场天安门广场
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申请号: EP15176708.4申请日: 2015-07-14
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公开(公告)号: EP3002819A1公开(公告)日: 2016-04-06
- 发明人: BAN, Yasumitsu , KAI, Manabu
- 申请人: FUJITSU LIMITED
- 申请人地址: 1-1, Kamikodanaka 4-chome, Nakahara-ku Kawasaki-shi, Kanagawa 211-8588 JP
- 专利权人: FUJITSU LIMITED
- 当前专利权人: FUJITSU LIMITED
- 当前专利权人地址: 1-1, Kamikodanaka 4-chome, Nakahara-ku Kawasaki-shi, Kanagawa 211-8588 JP
- 代理机构: Fenlon, Christine Lesley
- 优先权: JP2014202508 20140930
- 主分类号: H01Q1/22
- IPC分类号: H01Q1/22 ; H01Q7/00
摘要:
A frequency characteristic adjusting jig attached to a loop antenna includes: a conductive first member which is located along an outer periphery of a loop for a portion of a conductor forming the loop antenna, and which is electromagnetically coupled or electrically connected to the portion of the conductor; a conductive second member which is located along the outer periphery of the loop for another portion of the conductor, and which is electromagnetically coupled or electrically connected to the other portion of the conductor; and a conductive third member which connects the first and second members together via a different path than a path formed along the loop. The first and second members are chosen to have a length along the loop such that a frequency characteristic of the loop antenna is shifted according to the length.
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