Invention Publication
EP3014469A4 SYSTEMS AND METHODS FOR REVISIT LOCATION DETECTION
有权
祖尔·ÜBERARBEITUNGEINER STANDORTERKENNUNG
- Patent Title: SYSTEMS AND METHODS FOR REVISIT LOCATION DETECTION
- Patent Title (中): 祖尔·ÜBERARBEITUNGEINER STANDORTERKENNUNG
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Application No.: EP13886166Application Date: 2013-06-28
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Publication No.: EP3014469A4Publication Date: 2017-03-15
- Inventor: YANG XUE , YANG LEI , PUROHIT AVEEK
- Applicant: INTEL CORP
- Assignee: INTEL CORP
- Current Assignee: INTEL CORP
- Priority: US2013048498 2013-06-28
- Main IPC: G01S5/02
- IPC: G01S5/02 ; H04W4/02 ; H04W4/04 ; H04W64/00
Abstract:
A method of detecting a revisit position includes receiving at a computing system a plurality of position data points, each of the plurality of position data points including a signal scan measurement. The method farther includes calculating a first signal distance between a first signal scan measurement corresponding to a first position data point of the plurality of position data points and a second signal scan measurement corresponding to a second position data point of the plurality of position data points. The method further includes determining that the first signal distance is less than a first threshold, that the first signal distance is a local minimum for the first position data point, and the first signal distance is a local minimum for the second position data point. The method further includes, based on the determining, identifying the first and second position data points as revisit points.
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