发明公开
EP3019823A4 SYSTEM AND METHOD FOR CHARACTERIZING SURFACES USING SIZE DATA
有权
系统在VERFAHREN ZUR CHARAKTERISIERUNG VONOBERFLÄCHENMITTELSGRÖSSENDATEN
- 专利标题： SYSTEM AND METHOD FOR CHARACTERIZING SURFACES USING SIZE DATA
- 专利标题（中）： 系统在VERFAHREN ZUR CHARAKTERISIERUNG VONOBERFLÄCHENMITTELSGRÖSSENDATEN
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申请号： EP14823579申请日： 2014-07-07
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公开(公告)号： EP3019823A4公开(公告)日： 2017-03-01
- 发明人: JALLURI CHANDRA SEKHAR , HAMIDIEH YOUSSEF A
- 申请人： FORD GLOBAL TECH LLC
- 专利权人： FORD GLOBAL TECH LLC
- 当前专利权人： FORD GLOBAL TECH LLC
- 优先权： US201361844169 2013-07-09
- 主分类号： G01B5/00
- IPC分类号： G01B5/00 ; G01B7/12
摘要：
A system and method for characterizing surfaces includes using a measuring device to take size measurements of a manufactured product. The raw measurement data is transformed from a time-based domain to a frequency-based domain using a mathematical algorithm. The transformed size measurement data is then compared to predetermined limits within comparable frequency bands to characterize the surface of the manufactured product.
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