SYSTEM AND METHOD FOR CHARACTERIZING SURFACES USING SIZE DATA
    1.
    发明公开
    SYSTEM AND METHOD FOR CHARACTERIZING SURFACES USING SIZE DATA 有权
    系统在VERFAHREN ZUR CHARAKTERISIERUNG VONOBERFLÄCHENMITTELSGRÖSSENDATEN

    公开(公告)号:EP3019823A4

    公开(公告)日:2017-03-01

    申请号:EP14823579

    申请日:2014-07-07

    IPC分类号: G01B5/00 G01B7/12

    摘要: A system and method for characterizing surfaces includes using a measuring device to take size measurements of a manufactured product. The raw measurement data is transformed from a time-based domain to a frequency-based domain using a mathematical algorithm. The transformed size measurement data is then compared to predetermined limits within comparable frequency bands to characterize the surface of the manufactured product.

    摘要翻译: 用于表征表面的系统和方法包括使用测量装置对制成的产品进行尺寸测量。 使用数学算法将原始测量数据从基于时间的域变换到基于频率的域。 然后将转化的尺寸测量数据与可比较的频带内的预定限度进行比较,以表征制成品的表面。