发明公开
- 专利标题: SEMICONDUCTOR RADIATION DETECTOR, NUCLEAR MEDICINE DIAGNOSTIC DEVICE USING SAME, AND METHOD FOR PRODUCING SEMICONDUCTOR RADIATION DETECTOR
- 专利标题(中): 半导体辐射探测器,核医学诊断设备及其制造方法的半导体辐射检测
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申请号: EP14851321.1申请日: 2014-09-30
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公开(公告)号: EP3054321A1公开(公告)日: 2016-08-10
- 发明人: KOMINAMI Shinya , MOTAI Kumi , KOBASHI Keiji
- 申请人: Hitachi Aloka Medical, Ltd.
- 申请人地址: 22-1 Mure 6-chome Mitaka-shi, Tokyo 181-8622 JP
- 专利权人: Hitachi Aloka Medical, Ltd.
- 当前专利权人: Hitachi Aloka Medical, Ltd.
- 当前专利权人地址: 22-1 Mure 6-chome Mitaka-shi, Tokyo 181-8622 JP
- 代理机构: MERH-IP Matias Erny Reichl Hoffmann Patentanwälte PartG mbB
- 优先权: JP2013208107 20131003
- 国际公布: WO2015050141 20150409
- 主分类号: G01T1/24
- IPC分类号: G01T1/24 ; G01T1/161 ; H01L31/08
摘要:
A semiconductor radiation detector capable of measuring a γ-ray energy spectrum at 122 keV and 662 keV and having an energy resolution of no greater than 8 % with respect to 122 keV γ-rays, a nuclear medicine diagnostic device using the detector and a method for producing the semiconductor radiation detector are provided.
A semiconductor radiation detector 101 uses a semiconductor crystal 111 sandwiched by a cathode 112 and an anode 113. The semiconductor crystal 111 is configured from a thallium bromide single crystal in which the concentration of lead as an impurity is less than 0.1 ppm, the full width at half maximum of the (110) rocking curve in the X-ray diffraction in specimen tilting angle scan is no greater than 1.6 degrees, the full width at half maximum in specimen in-plane rotation angle scan is no greater than 3.5 degrees, and the full width at half maximum in X-ray incident angle scan is no greater than 1.3 degrees.
A semiconductor radiation detector 101 uses a semiconductor crystal 111 sandwiched by a cathode 112 and an anode 113. The semiconductor crystal 111 is configured from a thallium bromide single crystal in which the concentration of lead as an impurity is less than 0.1 ppm, the full width at half maximum of the (110) rocking curve in the X-ray diffraction in specimen tilting angle scan is no greater than 1.6 degrees, the full width at half maximum in specimen in-plane rotation angle scan is no greater than 3.5 degrees, and the full width at half maximum in X-ray incident angle scan is no greater than 1.3 degrees.
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