发明公开
- 专利标题: INSPECTION SYSTEM AND METHOD
- 专利标题(中): INSPEKTIONSSYSTEM UNDOVERHREN
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申请号: EP13824567.5申请日: 2013-12-22
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公开(公告)号: EP3084720A1公开(公告)日: 2016-10-26
- 发明人: O'CONNOR, John, P. , SHAUGHNESSY, Charles , ZANIN, Eric , ACCOMANDO, Nicholas, A.
- 申请人: Analogic Corporation
- 申请人地址: 8 Centennial Drive Peabody, MA 01960 US
- 专利权人: Analogic Corporation
- 当前专利权人: Analogic Corporation
- 当前专利权人地址: 8 Centennial Drive Peabody, MA 01960 US
- 代理机构: Patentanwälte Lambsdorff & Lange
- 国际公布: WO2015094380 20150625
- 主分类号: G06T7/00
- IPC分类号: G06T7/00
摘要:
One or more techniques and/or systems are described for inspecting an object, such as a tire. The system comprises a radiation imaging system configured to examine the object via radiation to generate a radiation image depicting an interior aspect of the object and a machine vision system configured to measure visible light and/or infrared wavelengths to generate a vision image depicting an exterior aspect of the object. The radiation image and the vision image may be correlated to facilitate an inspection of the object which includes an inspection of the exterior aspect as well as the interior aspect.
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