发明公开
- 专利标题： ARTICULATING CMM PROBE
- 专利标题（中）： GELENKIGE CMM-SONDE
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申请号： EP15730648.1申请日： 2015-06-10
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公开(公告)号： EP3155365A1公开(公告)日： 2017-04-19
- 发明人: FERRARI, Paul, A. , JUNG, Hyun, Kwon , MCKNIGHT, James, F.
- 申请人： Hexagon Metrology, Inc
- 申请人地址： 250 Circuit Drive North Kingstown, Rhode Island 02852 US
- 专利权人： Hexagon Metrology, Inc
- 当前专利权人： Hexagon Metrology, Inc
- 当前专利权人地址： 250 Circuit Drive North Kingstown, Rhode Island 02852 US
- 代理机构： Kaminski Harmann
- 优先权： US201462010943P 20140611; US201514733006 20150608
- 国际公布： WO2015191774 20151217
- 主分类号： G01B11/26
- IPC分类号： G01B11/26 ; G01D5/34 ; G01B5/012 ; G01B7/012 ; G01N29/22
摘要：
An articulating probe for use with a coordinate measuring machine comprises an attachment portion, a measuring portion, and at least one articulating joint. The attachment portion can be configured for attachment to a coordinate measuring machine. The measuring portion can be configured to contact an object to be measured by the coordinate measuring machine. The at least one articulating joint can be configured to allow rotation between the attachment portion and the measuring portion. Further, the articulating joint can comprise an angular sensor configured to measure an angle of the joint.
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