发明公开
EP3163602A2 METHOD OF PRODUCING A SEMICONDUCTOR DEVICE BY BONDING SILVER ON A SURFACE OF A SEMICONDUCTOR ELEMENT WITH SILVER ON A SURFACE OF A BASE IN AIR OR IN AN OXYGEN ENVIRONMENT 审中-公开
法生产半导体器件通过将银与银的半导体元件的表面上的碱在空气或氧气环境中的表面

  • 专利标题: METHOD OF PRODUCING A SEMICONDUCTOR DEVICE BY BONDING SILVER ON A SURFACE OF A SEMICONDUCTOR ELEMENT WITH SILVER ON A SURFACE OF A BASE IN AIR OR IN AN OXYGEN ENVIRONMENT
  • 专利标题(中): 法生产半导体器件通过将银与银的半导体元件的表面上的碱在空气或氧气环境中的表面
  • 申请号: EP16002297
    申请日: 2010-01-20
  • 公开(公告)号: EP3163602A2
    公开(公告)日: 2017-05-03
  • 发明人: KURAMOTO MASAFUMIOGAWA SATORUNIWA MIKI
  • 申请人: NICHIA CORP
  • 专利权人: NICHIA CORP
  • 当前专利权人: NICHIA CORP
  • 优先权: JP2009013713 2009-01-23
  • 主分类号: H01L21/58
  • IPC分类号: H01L21/58 H01L21/60 H01L33/40 H01L33/48 H01L33/62 H01S5/022
METHOD OF PRODUCING A SEMICONDUCTOR DEVICE BY BONDING SILVER ON A SURFACE OF A SEMICONDUCTOR ELEMENT WITH SILVER ON A SURFACE OF A BASE IN AIR OR IN AN OXYGEN ENVIRONMENT
摘要:
An object of the invention is to provide a method for producing a conductive member having low electrical resistance, and the conductive member is obtained using a low-cost stable conductive material composition that does not contain an adhesive. Disclosed is a method for producing a semiconductor device in which silver (520, 620, 720) formed by silver sputtering, silver vapour deposition or silver plating and provided on a surface of a base (500, 600, 700) and silver (140, 240, 340) formed by silver sputtering, silver vapour deposition or silver plating and provided on a surface of a semiconductor element (100, 200, 300) are bonded, the method comprising the steps of arranging the semiconductor element (100, 200, 300) on the base (500, 600, 700) such that said silver (140, 240, 340) provided on a surface of the semiconductor element (100, 200, 300) is in contact with said silver (520, 620, 720) provided on a surface of the base (500, 600, 700), temporarily bonding the semiconductor element (100, 200, 300) and the base (500, 600, 700) by applying a pressure or an ultrasonic vibration to the semiconductor element (100, 200, 300) or the base (500, 600, 700), and permanently bonding the semiconductor element (100, 200, 300) and the base (500, 600, 700) by applying heat having a temperature of 150 to 900°C to the semiconductor element (100, 200, 300) and the base (500, 600, 700) in air or in an oxygen environment. The step of temporarily bonding and the step of permanently bonding may be performed simultaneously. The semiconductor element (100, 200, 300) and the base (500, 600, 700) may be heated in advance at 150 to 900°C before the step of temporarily bonding. A pressure of 5 to 50 MPa may be applied before the step of temporarily bonding. The semiconductor element (100, 200, 300) may be a light emitting semiconductor element.
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