发明公开
- 专利标题: MEASUREMENT DATA PROCESSING SYSTEM
- 专利标题(中): 测量数据处理系统
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申请号: EP15822241.4申请日: 2015-06-05
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公开(公告)号: EP3171351A1公开(公告)日: 2017-05-24
- 发明人: TSUTSUMI, Daisuke , OKADA, Norihisa , UENO, Hidenori , TAMURA, Takuo , KASAI, Hiroaki
- 申请人: Hitachi, Ltd.
- 申请人地址: 6-6, Marunouchi 1-chome Chiyoda-ku Tokyo 100-8280 JP
- 专利权人: Hitachi, Ltd.
- 当前专利权人: Hitachi, Ltd.
- 当前专利权人地址: 6-6, Marunouchi 1-chome Chiyoda-ku Tokyo 100-8280 JP
- 代理机构: Moore, Graeme Patrick
- 优先权: JP2014144901 20140715
- 国际公布: WO2016009740 20160121
- 主分类号: G08C19/00
- IPC分类号: G08C19/00 ; G06K9/00
摘要:
A measurement data processing system capable of recognizing a measurement value stably without being subject to the influence of an environment is configured including a measuring instrument having a display part to display a measurement result, the display part being provided with a light source; a plurality of measuring instrument identification media placed on the display part of the measuring instrument and having respectively different transmittances of light from the light source; an image acquisition means that captures an image of a measurement result displayed on the display part and of the measuring instrument identification media; and a measurement data processing device that determines what is identified by the measuring instrument identification media from the image acquired, recognizes a measurement result according to image processing parameters retrieved based on measuring instrument identification information determined, and outputs measurement data or error data.
公开/授权文献
- EP3171351B1 MEASUREMENT DATA PROCESSING SYSTEM 公开/授权日:2022-02-16
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