发明公开
EP3204738A1 OPTISCHES FILTERELEMENT FÜR EINRICHTUNGEN ZUR UMWANDLUNG VON SPEKTRALEN INFORMATIONEN IN ORTSINFORMATIONEN
审中-公开
选择过滤器FÜREINRICHTUNGEN ZUR UMWANDLUNG VON SPEKTRALEN INFORMATIONEN在ORTSINFORMATIONEN
- 专利标题: OPTISCHES FILTERELEMENT FÜR EINRICHTUNGEN ZUR UMWANDLUNG VON SPEKTRALEN INFORMATIONEN IN ORTSINFORMATIONEN
- 专利标题(英): Optical filter element for devices for converting spectral information into location information
- 专利标题(中): 选择过滤器FÜREINRICHTUNGEN ZUR UMWANDLUNG VON SPEKTRALEN INFORMATIONEN在ORTSINFORMATIONEN
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申请号: EP15797588.9申请日: 2015-10-07
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公开(公告)号: EP3204738A1公开(公告)日: 2017-08-16
- 发明人: LANGNER, Maik , FRÖB, Hartmut , LYSSENKO, Vadim, G. , SUDZIUS, Markas , LEO, Karl
- 申请人: Technische Universität Dresden
- 申请人地址: Helmholtzstr. 10 01069 Dresden DE
- 专利权人: Technische Universität Dresden
- 当前专利权人: Technische Universität Dresden
- 当前专利权人地址: Helmholtzstr. 10 01069 Dresden DE
- 代理机构: Kailuweit & Uhlemann Patentanwälte Partnerschaft mbB
- 优先权: DE102014014983 20141007
- 国际公布: WO2016055048 20160414
- 主分类号: G01J3/02
- IPC分类号: G01J3/02 ; G01J3/36 ; G02B5/28 ; G01J3/26 ; G01J3/28
摘要:
The invention relates to an optical filter element (50) for devices (70) for converting spectral information into location information, using a connected detector (30) for detecting signals, said element having at least two microresonators (10, 11), a microresonator (10; 11) at least comprising - at least two superposed reflective layer structures (4, 6; 8, 9) which consist at least of a material layer (2) having a high refractive index and a material layer (3) having a low refractive index in an alternating sequence, as well as - at least one superposed resonance layer (5; 7) which is arranged between said two superposed reflective layer structures (4, 6; 8, 9). The filter element (50) comprises at least one transparent plane-parallel substrate (1) for optically decoupling said two microresonators (10, 11), the first microresonator (10; 11) being located on a first of the two opposing surfaces (51; 52) of said substrate (1), and the second microresonator (11; 10) being located on said substrate (1) on a second surface (54) thereof (1) that lies opposite the first surface (51), the resonance layer (5; 7) of at least one microresonator (10; 11), and/or the reflective layer structure (4, 6; 8, 9) that surrounds said resonance layer (5; 7), having a layer thickness which can vary along a horizontal axis (25) of said filter element (50).
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