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    ADJUSTABLE IMAGING SYSTEM, DEVICE AND METHOD
    3.
    发明公开
    ADJUSTABLE IMAGING SYSTEM, DEVICE AND METHOD 审中-公开

    公开(公告)号：EP4481341A1

    公开(公告)日：2024-12-25

    申请号：EP24382643.5

    申请日：2024-06-13

    Applicant: Urugus S.A.

    Inventor： Palombo Blascetta, Nicola ,  Brumovsky, Andres Francisco ,  Rueda, Delfina ,  Vilaseca, David Ivan

    IPC: G01J3/26 ,  G01J3/28 ,  G01J3/12 ,  G01N21/17

    Abstract: The disclosure provides a remote sensing system comprising, a detecting device configured to detect electromagnetic radiation, a first filter disposed at least partially within an optical path of the detecting device, and configured to allow electromagnetic radiation of wavelengths below a first threshold to pass towards the detecting device, and a second filter disposed at least partially within the optical path of the detecting device, and configured to allow electromagnetic radiation of wavelengths above a second threshold to pass towards the detecting device, wherein the first threshold is larger than the second threshold, and wherein at least one of a value of the first threshold or a value of the second threshold is determined based at least in part on a spectrum of interest. The disclosure also provides a method of operating the remote sensing system.

    AN INTERFEROMETER WITH ABSORBING LAYER
    6.
    发明公开
    AN INTERFEROMETER WITH ABSORBING LAYER 审中-实审

    公开(公告)号：EP4375629A1

    公开(公告)日：2024-05-29

    申请号：EP22214975.9

    申请日：2022-12-20

    Applicant: Murata Manufacturing Co., Ltd.

    Inventor： KAAJAKARI, Ville

    IPC: G01J3/26 ,  G01J3/02 ,  G01J3/453 ,  G02B26/00 ,  G01N21/3504

    CPC classification number: G01J3/26 ,  G02B26/001 ,  G01N21/3504 ,  G01J3/4535 ,  G01J3/0256 ,  G02B26/007

    Abstract: The disclosure relates to a micromechanical Fabry-Perot interferometer, wherein the interferometer comprises an at least partly transparent substrate; an illuminated area where the light is passed through the substrate; a reflector on the top surface of the substrate in the illuminated area; an absorbing reflector layer above the reflector in the illuminated area, which absorbs at least some wavelengths of the infrared light; an arrangement for determining the temperature of the absorbing reflector layer; and at least one actuator to adjust the gap between the reflector and the absorbing reflector layer. An advantage of the interferometer of the disclosure is that absorbing reflector layer absorbs the infrared light, and no separate infrared sensor is required. Additionally multiple wavelengths can be detected due to adjustable gap between the reflector and the absorbing reflector layer.

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