Invention Publication
EP3249393A1 TWO-DIMENSIONAL X-RAY DETECTOR POSITION CALIBRATION AND CORRECTION WITH DIFFRACTION PATTERN
审中-公开
二维X射线探测器位置校准和衍射模式校正
- Patent Title: TWO-DIMENSIONAL X-RAY DETECTOR POSITION CALIBRATION AND CORRECTION WITH DIFFRACTION PATTERN
- Patent Title (中): 二维X射线探测器位置校准和衍射模式校正
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Application No.: EP17170979.3Application Date: 2017-05-15
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Publication No.: EP3249393A1Publication Date: 2017-11-29
- Inventor: He, Bob Boaping
- Applicant: Bruker AXS, Inc.
- Applicant Address: 5465 E. Cheryl Parkway Madison, Wisconsin 53711-5373 US
- Assignee: Bruker AXS, Inc.
- Current Assignee: Bruker AXS, Inc.
- Current Assignee Address: 5465 E. Cheryl Parkway Madison, Wisconsin 53711-5373 US
- Agency: Kohler Schmid Möbus Patentanwälte
- Priority: US201615162889 20160524
- Main IPC: G01N23/207
- IPC: G01N23/207
Abstract:
A method of determining the spatial orientation of a two-dimensional detector in an X-ray diffractometry system, and calibrating the detector position in response thereto, uses diffraction patterns from a powder sample collected at a plurality of detector swing angles. The overlapping of the detected patterns indicates relative errors in the detector orientation. In particular, intersection points between the different diffraction patterns may be located, and their relative locations may be used to identify errors. Such errors may be in the detector position, or they may be errors in different rotational directions, such as roll, pitch or yaw. Determination and correction of the detector orientation using this method may be part of a calibration routine for the diffractometry system. Roll error may also be determined using a single measurement with the detector at a swing angle perpendicular to the X-ray beam.
Public/Granted literature
- EP3249393B1 TWO-DIMENSIONAL X-RAY DETECTOR POSITION CALIBRATION AND CORRECTION WITH DIFFRACTION PATTERN Public/Granted day:2021-10-13
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