发明公开
EP3249393A1 TWO-DIMENSIONAL X-RAY DETECTOR POSITION CALIBRATION AND CORRECTION WITH DIFFRACTION PATTERN 审中-公开
二维X射线探测器位置校准和衍射模式校正

  • 专利标题: TWO-DIMENSIONAL X-RAY DETECTOR POSITION CALIBRATION AND CORRECTION WITH DIFFRACTION PATTERN
  • 专利标题(中): 二维X射线探测器位置校准和衍射模式校正
  • 申请号: EP17170979.3
    申请日: 2017-05-15
  • 公开(公告)号: EP3249393A1
    公开(公告)日: 2017-11-29
  • 发明人: He, Bob Boaping
  • 申请人: Bruker AXS, Inc.
  • 申请人地址: 5465 E. Cheryl Parkway Madison, Wisconsin 53711-5373 US
  • 专利权人: Bruker AXS, Inc.
  • 当前专利权人: Bruker AXS, Inc.
  • 当前专利权人地址: 5465 E. Cheryl Parkway Madison, Wisconsin 53711-5373 US
  • 代理机构: Kohler Schmid Möbus Patentanwälte
  • 优先权: US201615162889 20160524
  • 主分类号: G01N23/207
  • IPC分类号: G01N23/207
TWO-DIMENSIONAL X-RAY DETECTOR POSITION CALIBRATION AND CORRECTION WITH DIFFRACTION PATTERN
摘要:
A method of determining the spatial orientation of a two-dimensional detector in an X-ray diffractometry system, and calibrating the detector position in response thereto, uses diffraction patterns from a powder sample collected at a plurality of detector swing angles. The overlapping of the detected patterns indicates relative errors in the detector orientation. In particular, intersection points between the different diffraction patterns may be located, and their relative locations may be used to identify errors. Such errors may be in the detector position, or they may be errors in different rotational directions, such as roll, pitch or yaw. Determination and correction of the detector orientation using this method may be part of a calibration routine for the diffractometry system. Roll error may also be determined using a single measurement with the detector at a swing angle perpendicular to the X-ray beam.
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