公开(公告)号：EP1732101B1

公开(公告)日：2010-07-28

申请号：EP06008182.5

申请日：2006-04-20

Applicant: Bruker AXS, Inc.

Inventor： Durst, Roger D. ,  He, Bob Boaping

IPC: H01J35/24

CPC classification number: H01J35/08 ,  G01N2223/204 ,  H01J35/18 ,  H01J35/24 ,  H01J2235/081

公开(公告)号：EP3385705A1

公开(公告)日：2018-10-10

申请号：EP18165543.2

申请日：2018-04-03

Applicant: Bruker AXS, Inc.

Inventor： He, Bob Boaping

IPC: G01N23/207

Abstract: A method and apparatus for performing an X-ray diffraction measurement with a diffractometer having an X-ray beam directed at a sample and a two-dimensional X-ray detector includes the performance of a physical scan during which the detector is moved through a scanning range in an angular direction about the sample position. To provide a uniform exposure time, the detector, when located at an extreme of the scanning range, is controlled to progressively change the portion of the detected X-ray energy that is used at a rate that maintains a uniform exposure time for each angular position in the scanning range. Alternatively, when located at an extreme of the range, the detector is kept stationary until a desired minimum exposure time is obtained for each angular position, after which the collected diffraction data is normalized relative to exposure time.

公开(公告)号：EP3185005A1

公开(公告)日：2017-06-28

申请号：EP16205335.9

申请日：2016-12-20

Applicant: Bruker AXS, Inc.

Inventor： He, Bob Boaping ,  Meding, Olaf ,  Maurer, Christian ,  Ollinger, Christoph

IPC: G01N23/207

CPC classification number: G01N23/207 ,  G01N23/20016 ,  G01N2223/051 ,  G01N2223/0566 ,  G01N2223/1016 ,  G01N2223/33 ,  G01N2223/401 ,  G06T5/001 ,  G06T5/50 ,  G06T2207/10116

Abstract: An X-ray diffraction system uses a two-dimensional detector to detect diffracted X-ray energy at a plurality of radial positions surrounding a sample location, the results at each position being combined to form a final diffraction image. To minimize smearing in the final image, the detector pixel intensities at each position are reapportioned among the pixel locations prior to being combined with the intensities collected at other positions. A two-dimensional pixel array space of the detector is projected onto a cylinder to form a projected pixel array space, and a virtual cylindrical detection surface representative of an ideal cylindrical detector is determined. An overlap between the pixels of the projected pixel array space and the pixels of the virtual cylindrical detection surface is determined, and pixel intensities are reapportioned accordingly. The reapportionment may include dividing each pixel space into subpixels and redistributing the subpixels among adjacent pixels.

Abstract translation: X射线衍射系统使用二维检测器来检测围绕样品位置的多个径向位置处的衍射X射线能量，每个位置处的结果被组合以形成最终衍射图像。 为了使最终图像中的污点最小化，每个位置处的检测器像素强度在与其他位置收集的强度相结合之前在像素位置之间重新分配。 将检测器的二维像素阵列空间投影到圆柱体上以形成投影像素阵列空间，并且确定代表理想柱面检测器的虚拟柱面检测表面。 投影像素阵列空间的像素与虚拟柱面检测表面的像素之间的重叠被确定，并且像素强度被相应地重新分配。 重新分配可以包括将每个像素空间分成子像素并在相邻像素之间重新分配子像素。

公开(公告)号：EP3185005B1

公开(公告)日：2018-06-20

申请号：EP16205335.9

申请日：2016-12-20

Applicant: Bruker AXS, Inc.

Inventor： He, Bob Boaping ,  Meding, Olaf ,  Maurer, Christian ,  Ollinger, Christoph

IPC: G01N23/207

CPC classification number: G01N23/207 ,  G01N23/20016 ,  G01N2223/051 ,  G01N2223/0566 ,  G01N2223/1016 ,  G01N2223/33 ,  G01N2223/401 ,  G06T5/001 ,  G06T5/50 ,  G06T2207/10116

Abstract: An X-ray diffraction system uses a two-dimensional detector to detect diffracted X-ray energy at a plurality of radial positions surrounding a sample location, the results at each position being combined to form a final diffraction image. To minimize smearing in the final image, the detector pixel intensities at each position are reapportioned among the pixel locations prior to being combined with the intensities collected at other positions. A two-dimensional pixel array space of the detector is projected onto a cylinder to form a projected pixel array space, and a virtual cylindrical detection surface representative of an ideal cylindrical detector is determined. An overlap between the pixels of the projected pixel array space and the pixels of the virtual cylindrical detection surface is determined, and pixel intensities are reapportioned accordingly. The reapportionment may include dividing each pixel space into subpixels and redistributing the subpixels among adjacent pixels.

公开(公告)号：EP3249393A1

公开(公告)日：2017-11-29

申请号：EP17170979.3

申请日：2017-05-15

Applicant: Bruker AXS, Inc.

Inventor： He, Bob Boaping

IPC: G01N23/207

CPC classification number: G01N23/207 ,  G01N2033/0091 ,  G01N2223/0566 ,  G01N2223/303 ,  G01N2223/32 ,  G01N2223/501

Abstract: A method of determining the spatial orientation of a two-dimensional detector in an X-ray diffractometry system, and calibrating the detector position in response thereto, uses diffraction patterns from a powder sample collected at a plurality of detector swing angles. The overlapping of the detected patterns indicates relative errors in the detector orientation. In particular, intersection points between the different diffraction patterns may be located, and their relative locations may be used to identify errors. Such errors may be in the detector position, or they may be errors in different rotational directions, such as roll, pitch or yaw. Determination and correction of the detector orientation using this method may be part of a calibration routine for the diffractometry system. Roll error may also be determined using a single measurement with the detector at a swing angle perpendicular to the X-ray beam.

Abstract translation: 一种确定X射线衍射系统中二维检测器的空间定向并响应于此来校准检测器位置的方法使用来自在多个检测器摆动角度处收集的粉末样本的衍射图案。 检测图案的重叠表示检测器方向的相对误差。 特别地，可以定位不同衍射图案之间的交点，并且它们的相对位置可以用于识别误差。 这些误差可能在检测器位置，或者它们可能是不同旋转方向的误差，例如滚动，俯仰或偏航。 使用该方法确定和校正检测器方位可能是衍射系统的校准程序的一部分。 滚动误差也可以使用检测器在垂直于X射线束的摆动角度下使用单次测量来确定。

公开(公告)号：EP1621873B1

公开(公告)日：2009-09-02

申请号：EP05016142.1

申请日：2005-07-26

Applicant: Bruker AXS, Inc.

Inventor： He, Bob Boaping ,  Bollig, Ryan C.

IPC: G01N23/207

CPC classification number: G01N23/20016

公开(公告)号：EP1653226A1

公开(公告)日：2006-05-03

申请号：EP05023347.7

申请日：2005-10-26

Applicant: Bruker AXS, Inc.

Inventor： He, Bob Boaping

IPC: G01N23/207

CPC classification number: G01N23/207 ,  G01N2223/5015

Abstract: A scanning line detector according to the present invention uses a detector with a linear arrangement of detection elements that is moved along a range of diffracted x-ray directions to collect data across a multidimensional detection area. The scanning line detector allows for the simulation of a two-dimensional detector system without the need for a two-dimensional detector. The detector may follow a desired path to simulate a desired shape, such as a cylinder. A slit may be included to limit the detector line width, and a scatter shield may be used to minimize noise from air-scattered x-rays. The detector may also use a specially designed monochromator for conditioning the diffracted x-rays. The detector may be rotatable about an axis parallel to a direction along which x-rays are diffracted, allowing it to be used in different orientations.

Abstract translation: 根据本发明的扫描线检测器使用具有沿着衍射X射线方向的范围移动的检测元件的线性布置的检测器，以跨越多维检测区域收集数据。 扫描线检测器允许对二维检测器系统的模拟，而不需要二维检测器。 检测器可以遵循期望的路径来模拟期望的形状，例如圆柱体。 可以包括狭缝以限制检测器线宽，并且可以使用散射屏蔽来使来自空气散射的X射线的噪声最小化。 检测器还可以使用专门设计的单色仪来调节衍射的X射线。 检测器可以围绕平行于X射线衍射的方向的轴线旋转，允许其以不同的取向使用。

公开(公告)号：EP3385705B1

公开(公告)日：2020-01-01

申请号：EP18165543.2

申请日：2018-04-03

Applicant: Bruker AXS, Inc.

Inventor： He, Bob Boaping

IPC: G01N23/207

公开(公告)号：EP1357377A3

公开(公告)日：2004-01-21

申请号：EP03008688.8

申请日：2003-04-16

Applicant: Bruker AXS, Inc.

Inventor： He, Bob Boaping ,  Jin, Frank Feng

IPC: G01N23/20

CPC classification number: G01N23/20

Abstract: An x-ray diffraction analysis system provides the automated x-ray diffraction analysis of a plurality of samples in a multiple-cell sample holder. The system includes x-ray source, a detector, a movable sample support and a retractable x-ray shield. The retractable shield is movable between a retracted position, in which optical positioning equipment may be used to locate each sample in the proper testing position, and an extended position, in which stray x-ray energy is blocked. The x-ray energy blocked by the shield includes x-rays diffracted from samples closer to the x-ray source than the sample under test, and x-rays from the source directed toward samples further from the source than the sample under test. Automated movement of the sample support and shield allows for an automated routine to sequentially position each sample, move the shield into the extended position and perform the desired analysis.

公开(公告)号：EP1357377A2

公开(公告)日：2003-10-29

申请号：EP03008688.8

申请日：2003-04-16

Applicant: Bruker AXS, Inc.

Inventor： He, Bob Boaping ,  Jin, Frank Feng

IPC: G01N23/20

CPC classification number: G01N23/20

Abstract: An x-ray diffraction analysis system provides the automated x-ray diffraction analysis of a plurality of samples in a multiple-cell sample holder. The system includes x-ray source, a detector, a movable sample support and a retractable x-ray shield. The retractable shield is movable between a retracted position, in which optical positioning equipment may be used to locate each sample in the proper testing position, and an extended position, in which stray x-ray energy is blocked. The x-ray energy blocked by the shield includes x-rays diffracted from samples closer to the x-ray source than the sample under test, and x-rays from the source directed toward samples further from the source than the sample under test. Automated movement of the sample support and shield allows for an automated routine to sequentially position each sample, move the shield into the extended position and perform the desired analysis.

Abstract translation: X射线衍射分析系统提供多细胞样品保持器中的多个样品的自动X射线衍射分析。 该系统包括x射线源，检测器，可移动样品支架和可伸缩x射线屏蔽。 可缩回的屏蔽件可以在缩回位置之间移动，缩进位置可以使用光学定位设备来将每个样品定位在适当的测试位置，以及延伸位置，其中杂散X射线能量被阻挡。 由屏蔽包围的x射线能量包括从比待测试样品更接近X射线源的样品衍射的x射线，以及来自源的X射线指向比测试样品更远的源。 样品支架和屏蔽件的自动移动允许自动程序顺序地定位每个样品，将屏蔽件移动到延伸位置并执行所需的分析。