发明公开
- 专利标题: SECURITY INSPECTION APPARATUS AND METHOD
- 专利标题(中): 安全检查设备和方法
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申请号: EP17173471.8申请日: 2017-05-30
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公开(公告)号: EP3279701A1公开(公告)日: 2018-02-07
- 发明人: CHEN, Zhiqiang , ZHAO, Ziran , CUI, Jin , LIN, Dong , HU, Bin , TAN, Xianshun , WANG, Hong
- 申请人: Nuctech Company Limited
- 申请人地址: 2nd Floor, Block A TongFang Building, Shuangqinglu, Haidian District Beijing 100084 CN
- 专利权人: Nuctech Company Limited
- 当前专利权人: Nuctech Company Limited
- 当前专利权人地址: 2nd Floor, Block A TongFang Building, Shuangqinglu, Haidian District Beijing 100084 CN
- 代理机构: Held, Stephan
- 优先权: CN201610634086 20160805
- 主分类号: G01V5/00
- IPC分类号: G01V5/00
摘要:
The present invention proposes a security inspection apparatus and method, relates to the technical field of radiation, wherein the security inspection apparatus of the invention comprises: radiation emitting device, back-scatter detector, size-distance detecting device, orientation adjusting device; the back-scatter detector located between the radiation emitting device and an inspected object; the size-distance detecting device located between the radiation emitting device and the inspected object, for detecting a size of the inspected object and/or a distance between the inspected object and the size-distance detecting device; and the orientation adjusting device adjusts orientation of the radiation emitting device according to the size of the inspected object and/or the distance from the inspected object. Such a security inspection apparatus can detect size and position information of the inspected object, and automatically adjust the position of the radiation emitting device according to the size and position of the inspected object, thereby reducing or avoiding detection dead angles, and improving accuracy of the detection.
公开/授权文献
- EP3279701B1 SECURITY INSPECTION APPARATUS AND METHOD 公开/授权日:2024-09-25
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